Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Puja Kadkhoda"'
Publikováno v:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization.
The development of characterization tools for the deep-ultraviolet (DUV)/vacuum-ultraviolet (VUV) spectral range gains of increasing importance considering the applicability of optics in adequate facilities. At the Laser Zentrum Hannover, procedures
Publikováno v:
Optical Interference Coatings.
Fluoride multilayer coatings are produced by thermal evaporation techniques using an on-line VUV spectrophotometer to monitor the spectra of the growing system. Online spectra and optical data acquired after exposure to the ambient are discussed.
Publikováno v:
SPIE Proceedings.
Optical scattering is a fundamental loss mechanism in high power laser applications, especially for optical systems in the DUV/VUV spectral range. For recording of total optical scattering (TS) several standardized measurement procedures which are op
Publikováno v:
SPIE Proceedings.
In the course of the rapid progress of DUV/VUV lasers and their employment in semiconductor lithography, micro material processing, and medical surgery systems, the characterization of optical components in this spectral region gains of increasing im
Publikováno v:
SPIE Proceedings.
Light scattering is an optical loss mechanism, which reduces the efficiency of imagin systems and beam guiding arrangements in many applications of high power excimer lasers. Therefore, the measurement of total scattering by optical components plays
Autor:
Stefan Gliech, Markus Tilsch, Christian Jolie, Rainer G. Schuhmann, Claude Amra, Detlev Ristau, Norbert Reng, Carole Deumie, Tomas Lindstroem, Carl-Gustaf Ribbing, Uwe Schuhmann, A. Mueller, Helmut Kessler, Angela Duparré, Hans Lauth, Puja Kadkhoda, Jean M. Bennett
Publikováno v:
SPIE Proceedings.
The measurement of total scatter losses is a major prerequisite for the development, optimization and commercialization of high quality optical components. Especially in laser technology, optical scattering gained of importance in the source of the d
Publikováno v:
SPIE Proceedings.
Light scattering of optical laser components gains in importance for the short wavelength range. A standard procedure for the measurement of 'total scattering' is described in the Draft International Standard ISO/DIS 13696, which is based on integrat