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pro vyhledávání: '"Pui Ying Yeo"'
Autor:
Pik Kee Tan, Patrick Khoo, Yuzhe Zhao, Siong Luong Ting, Hao Tan, Pui Ying Yeo, Yanlin Pan, C. Q. Chen
Publikováno v:
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA).
With continuous technology scaling of semiconductor devices, conventional physical failure analysis (PFA) techniques becomes more and more challenging with the increased number of transistors and layer stacks. This paper presents a new memory bit-cou
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b1fe84ff5ee139f5d8a0e8c2e4193469
https://doi.org/10.1109/ipfa47161.2019.8984871
https://doi.org/10.1109/ipfa47161.2019.8984871
