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of 237
pro vyhledávání: '"Puente León, F."'
Autor:
Puente León, F., Kammel, S.
Publikováno v:
In Measurement 2006 39(6):536-546
Autor:
Trushkina, Anna V., Vasilev, Aleksandr S., Serikova, Mariya G., Anisimov, A., Beyerer, J., Puente León, F.
Publikováno v:
Automated Visual Inspection and Machine Vision II, 10334
In this work it is shown that high-intensity microprismatic tapes have a potential to be used as a good substrate for bright and cheap fiducial marks in machine vision metrology applications. The drawback of the tapes is that they have technological
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