Zobrazeno 1 - 10
of 34
pro vyhledávání: '"Pu, Tanchao"'
Autor:
Rendón-Barraza, Carolina, Chan, Eng Aik, Yuan, Guanghui, Adamo, Giorgio, Pu, Tanchao, Zheludev, Nikolay I.
Microscopes and various forms of interferometers have been used for decades in optical metrology of objects that are typically larger than the wavelength of light {\lambda}. However, metrology of subwavelength objects was deemed impossible due to the
Externí odkaz:
http://arxiv.org/abs/2005.04905
We report the experimental demonstration of deeply subwavelength far-field optical imaging of unlabelled samples with resolution better than $\lambda/20$. We beat the ~$\lambda$/2 diffraction limit of conventional optical microscopy several times ove
Externí odkaz:
http://arxiv.org/abs/2001.01068
Autor:
Chan Eng Aik, Rendón-Barraza Carolina, Wang Benquan, Pu Tanchao, Ou Jun-Yu, Wei Hongxin, Adamo Giorgio, An Bo, Zheludev Nikolay I.
Publikováno v:
Nanophotonics, Vol 12, Iss 14, Pp 2807-2812 (2023)
Particle counting is of critical importance for nanotechnology, environmental monitoring, pharmaceutical, food and semiconductor industries. Here we introduce a super-resolution single-shot optical method for counting and mapping positions of subwave
Externí odkaz:
https://doaj.org/article/e55115a0c49a45d7b5bf5f31001bede8
Publikováno v:
In Optics Communications 1 May 2022 510
Autor:
Pu, Tanchao1 (AUTHOR), Ou, Jun‐Yu1 (AUTHOR), Savinov, Vassili1 (AUTHOR), Yuan, Guanghui2 (AUTHOR), Papasimakis, Nikitas1 (AUTHOR), Zheludev, Nikolay I.1,2 (AUTHOR) zheludev@soton.ac.uk
Publikováno v:
Advanced Science. 1/6/2021, Vol. 8 Issue 1, p1-8. 8p.
Autor:
Adamo, Giorgio, Aik Chan, Eng, Li, Jinxiang, Liu, Tongjun, Kurdiumov, Sergei, MacDonald, Kevin F., Ou, Jun-Yu, Papasimakis, Nikitas, Plum, Eric, Pu, Tanchao, Rendon-Barraza, Carolina, Wang, Yu, Zheludev, Nikolai
Publikováno v:
Metamaterials XIII.
The resolution of conventional microscopy is limited to a half of the wavelength of light. We report on recent advances in applications of deep learning and topologically structured light to far-field nondestructive imaging with deep subwavelength re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4b7ff36e6c8a4a72e8aff61bfe5aea69
https://doi.org/10.1117/12.2624471
https://doi.org/10.1117/12.2624471
Autor:
Rendon-Barraza, Carolina, Chan, Eng Aik, Li, Jinxiang, Liu, Tongjun, MacDonald, Kevin F., Ou, Jun-Yu, Papas, Dimitrios, Papasimakis, Nikitas, Plum, Eric, Pu, Tanchao, Yuan, Guanghui, Zheludev, Nikolai
We demonstrate metrology and odometry (detection of change in position over time) with resolution in the nanometric - picometric scales by analyzing electrons or topologically structured light scattered from the nanostructures using artificial intell
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______348::88092406988242c0a5977a04930caf8d
https://eprints.soton.ac.uk/447539/
https://eprints.soton.ac.uk/447539/
Autor:
Rendon-Barraza, Carolina, Chan, Eng Aik, Kurdiumov, Sergei, Liu, Tongjun, MacDonald, Kevin F., Ou, Jun-Yu, Papasimakis, Nikitas, Pu, Tanchao, Yuan, Guanghui, Zheludev, Nikolai
We report on recent advances in applications of deep learning and topologically structured light to far-field non-destructive imaging with deep subwalength resolution and picometric metrology.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______348::a4dc5b7e20e716d8618150e0a98a996b
https://eprints.soton.ac.uk/450346/
https://eprints.soton.ac.uk/450346/
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The visualization process of manufacturing CFSZPs
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4d300fa57c699ed809ac4096f1fb6a61