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Publikováno v:
2018 2nd International Conference on Trends in Electronics and Informatics (ICOEI).
As integrated circuit feature size is continuously shrinking, test data reduction and power consumption have become a great challenge. In DFT, scan testing considers as an important aspect to avoid destructive chips and improve yield. Test data reduc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::75d45eb5e8ba3fa67bac2bff712666ea
https://doi.org/10.1109/icoei.2018.8553799
https://doi.org/10.1109/icoei.2018.8553799
