Prediction and characterization of compound phase formation at Ge-metal interfaces in thin film structures

Autor: Marais, T.K., Taylor, E., Ndwandwe, M., Spoelstra, B., Pretorias, R.

Publikováno v: Nuclear Instruments and Methods in Physics Research Section B; March 1994, Vol. 85 Issue: 1-4 p183-187, 5p