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pro vyhledávání: '"Prerana Chakrabarti"'
Autor:
Prerana Chakrabarti, Anna Wildeis, Markus Hartmann, Robert Brandt, Ralph Döhrmann, Giovanni Fevola, Christina Ossig, Michael Elias Stuckelberger, Jan Garrevoet, Ken Vidar Falch, Vanessa Galbierz, Gerald Falkenberg, Peter Modregger
Publikováno v:
Journal of Synchrotron Radiation, Vol 29, Iss 6, Pp 1407-1413 (2022)
X-ray diffraction with high spatial resolution is commonly used to characterize (poly)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing sample
Externí odkaz:
https://doaj.org/article/6160692d5bf84585be5db3cf013f94a8