Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Prathiba Muthukrishnan"'
Publikováno v:
Results in Engineering, Vol 23, Iss , Pp 102810- (2024)
Faster-than-at-speed testing (FAST) approach significantly enhances the detection quality of small delay defects (SDD). However, it encounters the challenge of an increased number of test options. Also, selecting the optimal test clock periods is cru
Externí odkaz:
https://doaj.org/article/4862748f181448808333629a2907f27e
Publikováno v:
IEEE Access, Vol 11, Pp 115556-115567 (2023)
Small delay defects (SDD) based test escapes are caused by the nature of transition delay fault (TDF) ATPG, which propagates the fault effect along the shorter path in the interest of run time. However, owing to the benefits of a lesser pattern count
Externí odkaz:
https://doaj.org/article/3ae54a7f860541dc99d57529818da042
Publikováno v:
Applied Sciences, Vol 12, Iss 18, p 9103 (2022)
As technology scales down, digital VLSI circuits are prone to many manufacturing defects. These defects may result in functional and delay-related circuit failures. The number of test escapes grows when technology is downscaled. Small delay defects (
Externí odkaz:
https://doaj.org/article/ac64c497229f4304b1754d25a1a08a08
Autor:
Sivanantham S, Prathiba Muthukrishnan
Publikováno v:
Applied Sciences. 12:9103
As technology scales down, digital VLSI circuits are prone to many manufacturing defects. These defects may result in functional and delay-related circuit failures. The number of test escapes grows when technology is downscaled. Small delay defects (