Zobrazeno 1 - 10
of 28
pro vyhledávání: '"Prasanna Ravi"'
Publikováno v:
Transactions on Cryptographic Hardware and Embedded Systems, Vol 2024, Iss 2 (2024)
In an effort to circumvent the high cost of standard countermeasures against side-channel attacks in post-quantum cryptography, some works have developed low-cost detection-based countermeasures. These countermeasures try to detect maliciously genera
Externí odkaz:
https://doaj.org/article/071439e967aa4c0b8a193bfb85a899e7
Publikováno v:
Transactions on Cryptographic Hardware and Embedded Systems, Vol 2023, Iss 2 (2023)
In this work, we propose generic and novel adaptations to the binary Plaintext-Checking (PC) oracle based side-channel attacks for Kyber KEM. These attacks operate in a chosen-ciphertext setting, and are fairly generic and easy to mount on a given ta
Externí odkaz:
https://doaj.org/article/0ed53ae46dee4ee4b391235c33763a4a
Publikováno v:
Transactions on Cryptographic Hardware and Embedded Systems, Vol 2023, Iss 2 (2023)
In this work, we present the first fault injection analysis of the Number Theoretic Transform (NTT). The NTT is an integral computation unit, widely used for polynomial multiplication in several structured lattice-based key encapsulation mechanisms (
Externí odkaz:
https://doaj.org/article/11cbe31452464388b85a8163aa565391
Publikováno v:
Transactions on Cryptographic Hardware and Embedded Systems, Vol 2022, Iss 3 (2022)
Persistent Fault Analysis (PFA) is an innovative and powerful analysis technique in which fault persists throughout the execution. The prior prominent results on PFA were on SPN block ciphers, and the security of Feistel ciphers against this attack h
Externí odkaz:
https://doaj.org/article/323b1738754944e2bae392a58c19fe98
Autor:
Prasanna Ravi, Martianus Frederic Ezerman, Shivam Bhasin, Anupam Chattopadhyay, Sujoy Sinha Roy
Publikováno v:
Transactions on Cryptographic Hardware and Embedded Systems, Vol 2022, Iss 1 (2021)
In this work, we propose generic and novel side-channel assisted chosenciphertext attacks on NTRU-based key encapsulation mechanisms (KEMs). These KEMs are IND-CCA secure, that is, they are secure in the chosen-ciphertext model. Our attacks involve t
Externí odkaz:
https://doaj.org/article/16817e14128f47669e2cd845b0e340f1
Publikováno v:
Transactions on Cryptographic Hardware and Embedded Systems, Vol 2022, Iss 1 (2021)
We focus on the multiple persistent faults analysis in this paper to fill existing gaps in its application in a variety of scenarios. Our major contributions are twofold. First, we propose a novel technique to apply persistent fault apply in the mult
Externí odkaz:
https://doaj.org/article/9dc2097cbaab480a8290d3b732336ede
Publikováno v:
Transactions on Cryptographic Hardware and Embedded Systems, Vol 2020, Iss 3 (2020)
In this work, we demonstrate generic and practical EM side-channel assisted chosen ciphertext attacks over multiple LWE/LWR-based Public Key Encryption (PKE) and Key Encapsulation Mechanisms (KEM) secure in the chosen ciphertext model (IND-CCA securi
Externí odkaz:
https://doaj.org/article/b8c0f18e08ba4ef0809496ccf2cbfa47
Publikováno v:
IEEE Transactions on Information Forensics and Security. 17:684-699
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::025533b5ff39dcf4ea56b51da8b35090
https://doi.org/10.1109/tifs.2021.3139268
https://doi.org/10.1109/tifs.2021.3139268
Publikováno v:
Transactions on Cryptographic Hardware and Embedded Systems, Vol 2022, Iss 1 (2021)
We focus on the multiple persistent faults analysis in this paper to fill existing gaps in its application in a variety of scenarios. Our major contributions are twofold. First, we propose a novel technique to apply persistent fault apply in the mult
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::338e26d881f4ca07b4672af6adebec21
https://doi.org/10.46586/tches.v2022.i1.367-390
https://doi.org/10.46586/tches.v2022.i1.367-390
Autor:
Piyush Beegala, Debapriya Basu Roy, Prasanna Ravi, Shivam Bhasin, Anupam Chattopadhyay, Debdeep Mukhopadhyay
Publikováno v:
2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ddb2d58c06fd051fa0c3709c08afb620
https://doi.org/10.1109/dft56152.2022.9962359
https://doi.org/10.1109/dft56152.2022.9962359