Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Prasalovich, S."'
Publikováno v:
European Physical Journal D (EPJ D). Oct2005, Vol. 36 Issue 1, p79-88. 10p. 8 Diagrams, 2 Charts.
Publikováno v:
Journal of Chemical Physics; 8/22/2005, Vol. 123 Issue 8, p084317, 10p, 1 Chart, 7 Graphs
Silicon samples implanted by small mass-selected Arn* and (N2)n* cluster ions with energies in the range of 3-18 keV/cluster are studied using atomic force microscopy. Control samples implanted by Ar* ions with the energies of 1.5-5.0 keV are used fo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1594::8c6e01ebeba68fc6222e005c2e09ee0d
http://elib.bsu.by/handle/123456789/206800
http://elib.bsu.by/handle/123456789/206800
Autor:
Popok, V. N., Azarko, I. I., Khaibullin, R. I., Stepanov, A. L., Hinatowicz, V., Mackova, A., Prasalovich, S. V.
Publikováno v:
Applied Physics A: Materials Science & Processing; 2004, Vol. 78 Issue 7, p1067-1072, 6p
Publikováno v:
Review of Scientific Instruments; Dec2002, Vol. 73 Issue 12, p4283, 5p
Autor:
Popok, V. N., Azarko, I. I., Khaibullin, R. I., Andrey Stepanov, Hnatowicz, V., Mackova, A., Prasalovich, S. V.
Publikováno v:
Scopus-Elsevier
Aalborg University
Aalborg University
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::30a6604fa3ede44c70bb6ea17828f59a
http://www.scopus.com/inward/record.url?eid=2-s2.0-1842611507&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-1842611507&partnerID=MN8TOARS