Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Prasad V. Alluri"'
Autor:
Jamal Ramdani, Vidya Kaushik, Jay Curless, William J. Ooms, Jeffrey M. Finder, Corey Overgaard, S Pietambaram, Zhiyi Jimmy Yu, J. A. Hallmark, K. Eisenbeiser, Ravindranath Droopad, Prasad V. Alluri
Publikováno v:
Applied Surface Science. :127-133
Single-crystal SrTiO3 has been grown on Si(100) using molecular beam epitaxy (MBE). The growth conditions, especially at the initial stage of nucleation, have a great impact on the SrTiO3/Si interface. A regrowth of an amorphous interfacial layer as
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::93244bf681c193a9731068424eac5cb6
https://doi.org/10.1016/s0169-4332(00)00050-7
https://doi.org/10.1016/s0169-4332(00)00050-7
Publikováno v:
Integrated Ferroelectrics. 21:305-318
SrTiO3 (or ST) and (Ba, Sr)TiO3 (or BST) thin films were deposited on Pt passivated Si substrates below 400°C, using β-diketonates of Ba, Sr, and Ti, electron cyclotron resonance (ECR) plasma-enhanced chemical vapor deposition (CVD), and direct liq
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f2711569f10eeca233b8db032219031
https://doi.org/10.1080/10584589808202072
https://doi.org/10.1080/10584589808202072
Autor:
Sandwip Dey, Prasad V. Alluri
Publikováno v:
MRS Bulletin. 21:44-48
The current trend in electronic-systems technology is to produce compact, lighter, low-power-dissipating, affordable, reliable, and mobile information systems. These factors favor the augmentation of interface systems that sense, source, store, displ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e19f5e00075f13dd5587b68a45b52f2d
https://doi.org/10.1557/s0883769400046078
https://doi.org/10.1557/s0883769400046078
Autor:
Alexander A. Demkov, Jamal Ramdani, Ran Liu, Stefan Zollner, James N. Hilfiker, Rich Gregory, Z. Yu, John A. Woollam, Peter Fejes, Prasad V. Alluri, T. E. Tiwald, Jay Curless, Ravindranath Droopad
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 18:2242
We have studied the optical properties (complex dielectric function) of bulk SrTiO3 and thin films on Si and Pt using spectroscopic ellipsometry over a very broad spectral range, starting at 0.03 eV [using Fourier transform infrared (FTIR) ellipsomet
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::daaf1cb5eb14ac277f3b910235131d9f
https://doi.org/10.1116/1.1303741
https://doi.org/10.1116/1.1303741