Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Pranoy Deb Shuvra"'
Autor:
Pranoy Deb Shuvra, Shamus McNamara
Publikováno v:
AIP Advances, Vol 4, Iss 12, Pp 127158-127158-11 (2014)
A novel electromechanical energy storage device is reported that has the potential to have high energy densities. It can efficiently store both mechanical strain energy and electrical energy in the form of an electric field between the electrodes of
Externí odkaz:
https://doaj.org/article/b89f69f37a134dec8e828e767b342568
Autor:
Ronald D. Schrimpf, Pranoy Deb Shuvra, Charles N. Arutt, Michael L. Alles, Ji-Tzuoh Lin, Daniel M. Fleetwood, Jimmy L. Davidson, Shamus McNamara, Kevin M. Walsh, Bruce W. Alphenaar
Publikováno v:
IEEE Transactions on Nuclear Science. 66:397-404
Lighter doping, pretreatment (exposure to hydrogen in a steam bath), and lower dose rate are each found to exacerbate 10-keV X-ray-induced negative frequency shifts and increase in resistivity measured in T-shaped, asymmetric, piezoresistive, microma
Autor:
Mike Alles, Ji-Tzuoh Lin, Peng Wang, Michael W. McCurdy, Pranoy Deb Shuvra, Jimmy L. Davidson, Shamus McNamara, Kevin M. Walsh, Bruce W. Alphenaar
Publikováno v:
2020 IEEE 33rd International Conference on Micro Electro Mechanical Systems (MEMS).
We present electrical measurements of gallium nitride/Aluminum nitride (GaN/AlN) microelectromechanical system (MEMS) beams under the combined influence of strain and X-ray radiation. These results are used to understand the mechanism for the observe
Autor:
Jimmy L. Davidson, Daniel M. Fleetwood, En Xia Zhang, Michael W. McCurdy, Ronald D. Schrimpf, Michael L. Alles, Wenjun Liao, Pranoy Deb Shuvra, Shamus McNamara, Kevin M. Walsh, Ji-Tzuoh Lin, Huiqi Gong, Bruce W. Alphenaar, Andrew L. Sternberg, Robert A. Reed
Publikováno v:
IEEE Transactions on Nuclear Science. 65:34-38
The response of silicon-based microelectromechanical systems resonators to proton irradiation is determined by the combined effects of displacement damage and total ionizing dose (TID). Displacement damage (DD) can lead to carrier removal, which tend
Autor:
Bruce W. Alphenaar, Pranoy Deb Shuvra, Charles N. Arutt, Andrew L. Sternberg, Michael L. Alles, Huiqi Gong, En Xia Zhang, Wenjun Liao, Robert A. Reed, Kevin M. Walsh, Ji-Tzuoh Lin, Jimmy L. Davidson, Shamus McNamara, Daniel M. Fleetwood, Ronald D. Schrimpf
Publikováno v:
IEEE Transactions on Nuclear Science. 65:58-63
Total-ionizing-dose-induced resonance frequency shifts in piezoresistive micromachined cantilevers are experimentally shown to be dose-rate dependent. Devices were irradiated to 1 Mrad(SiO2) at rates from 5.4 to 30.3 krad(SiO2)/min, with lower rate e
Autor:
Pranoy Deb Shuvra, Michael W. McCurdy, Huiqi Gong, Wenjun Liao, Andrew L. Sternberg, Bruce W. Alphenaar, Jimmy L. Davidson, Kevin M. Walsh, Michael L. Alles, Robert A. Reed, Daniel M. Fleetwood, En Xia Zhang, Ronald D. Schrimpf, Ji-Tzuoh Lin, Shamus McNamara
Publikováno v:
IEEE Transactions on Nuclear Science. 64:263-268
We evaluate the response of T-shaped, asymmetric, piezoresistive, micromachined cantilevers fabricated on p-type Si to 10-keV X-ray irradiation. The resonant frequency decreases by 25 ppm at 2.1 Mrad(SiO2), and partially recovers during post-irradiat
Autor:
Hailong Chen, Hao Jia, Ji-Tzuoh Lin, Philip X.-L. Feng, Bruce W. Alphenaar, Pranoy Deb Shuvra
Publikováno v:
2019 IEEE 32nd International Conference on Micro Electro Mechanical Systems (MEMS).
We report on the first experimental demonstration of micromechanical feedback oscillators based on vibrating gallium nitride/aluminum nitride (GaN/AlN) heterostructure doubly-clamped string resonators (∼0.4–4 MHz) for real-time detection of middl
Autor:
Pranoy Deb Shuvra, Jerry A. Yang, Bruce W. Alphenaar, Ji-Tzuoh Lin, Kevin M. Walsh, Shamus McNamara
Publikováno v:
Journal of Micromechanics and Microengineering. 30:075006
Publikováno v:
Proceedings of the 73rd International Symposium on Molecular Spectroscopy.