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pro vyhledávání: '"Pradheesh Ramachandran"'
Autor:
Ralfy Kenaz, Saptarshi Ghosh, Pradheesh Ramachandran, Kenji Watanabe, Takashi Taniguchi, Hadar Steinberg, Ronen Rapaport
Publikováno v:
ACS Nano. 17:9188-9196
As properties of mono- to few layers of exfoliated van der Waals heterostructures are heavily dependent on their thicknesses, accurate thickness measurement becomes imperative in their study. Commonly used atomic force microscopy and Raman spectrosco