Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Prabhu, Sarvesh"'
Autor:
Prabhu, Sarvesh P.
Test and Diagnosis are critical areas in semiconductor manufacturing. Every chip manufactured using a new or premature technology or process needs to be tested for manufacturing defects to ensure defective chips are not sold to the customer. Conventi
Externí odkaz:
http://hdl.handle.net/10919/51181
Autor:
Prabhu, Sarvesh P.
Symbolic execution-based test generation is gaining popularity for software test generation. The increasing complexity of the software program is posing new challenges in software execution-based test generation because of the path explosion problem.
Externí odkaz:
http://hdl.handle.net/10919/40931
http://scholar.lib.vt.edu/theses/available/etd-02062012-230655/
http://scholar.lib.vt.edu/theses/available/etd-02062012-230655/
Publikováno v:
2015 IEEE International Test Conference (ITC); 2015, p1-10, 10p
Publikováno v:
2014 International Test Conference; 2014, p1-9, 9p
Publikováno v:
2012 25th International Conference on VLSI Design; 1/ 1/2012, p394-399, 6p
Publikováno v:
2012 IEEE 30th VLSI Test Symposium (VTS); 1/ 1/2012, p215-220, 6p
Publikováno v:
2014 19th IEEE European Test Symposium (ETS); 2014, p1-2, 2p
Publikováno v:
2013 18th IEEE European Test Symposium (ETS); 2013, p1-1, 1p