Zobrazeno 1 - 10
of 44
pro vyhledávání: '"Porfirev AP"'
Autor:
Porfirev AP; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, Molodogvardeyskaya Str. 151, 443001 Samara, Russia.; Image Processing Systems Institute, National Research Centre 'Kurchatov Institute', Molodogvardeyskaya Str. 151, 443001 Samara, Russia., Khonina SN; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, Molodogvardeyskaya Str. 151, 443001 Samara, Russia.; Image Processing Systems Institute, National Research Centre 'Kurchatov Institute', Molodogvardeyskaya Str. 151, 443001 Samara, Russia.; Scientific Research Laboratory of Automated Systems of Scientific Research (SRL-35), Samara National Research University, Moskovskoye Shosse 34, 443086 Samara, Russia., Ivliev NA; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, Molodogvardeyskaya Str. 151, 443001 Samara, Russia.; Image Processing Systems Institute, National Research Centre 'Kurchatov Institute', Molodogvardeyskaya Str. 151, 443001 Samara, Russia.; Scientific Research Laboratory of Automated Systems of Scientific Research (SRL-35), Samara National Research University, Moskovskoye Shosse 34, 443086 Samara, Russia., Porfirev DP; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, Molodogvardeyskaya Str. 151, 443001 Samara, Russia.; Scientific Research Laboratory of Automated Systems of Scientific Research (SRL-35), Samara National Research University, Moskovskoye Shosse 34, 443086 Samara, Russia.; The Center for Laboratory Astrophysics, Samara Branch of P.N. Lebedev Physical Institute of the Russian Academy of Sciences, 221 Novo-Sadovaya Str., 443011 Samara, Russia., Kazanskiy NL; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, Molodogvardeyskaya Str. 151, 443001 Samara, Russia.; Image Processing Systems Institute, National Research Centre 'Kurchatov Institute', Molodogvardeyskaya Str. 151, 443001 Samara, Russia.; Scientific Research Laboratory of Automated Systems of Scientific Research (SRL-35), Samara National Research University, Moskovskoye Shosse 34, 443086 Samara, Russia.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2024 Feb 10; Vol. 24 (4). Date of Electronic Publication: 2024 Feb 10.
Autor:
Rosen J; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, 8410501 Beer-Sheva, Israel.; Institute of Physics, University of Tartu, W. Ostwaldi 1, 50411 Tartu, Estonia., Alford S; Department of Anatomy and Cell Biology, University of Illinois at Chicago, 808 South Wood Street, Chicago, IL 60612 USA., Allan B; Faculty of Science Engineering and Built Environment, Deakin University, Princes Highway, Warrnambool, VIC 3280 Australia., Anand V; Institute of Physics, University of Tartu, W. Ostwaldi 1, 50411 Tartu, Estonia.; Optical Sciences Center and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Computing and Engineering Technologies, Optical Sciences Center, Swinburne University of Technology, Hawthorn, Melbourne, VIC 3122 Australia., Arnon S; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, 8410501 Beer-Sheva, Israel., Arockiaraj FG; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, 8410501 Beer-Sheva, Israel.; Institute of Physics, University of Tartu, W. Ostwaldi 1, 50411 Tartu, Estonia., Art J; Department of Anatomy and Cell Biology, University of Illinois at Chicago, 808 South Wood Street, Chicago, IL 60612 USA., Bai B; Electrical and Computer Engineering Department, Bioengineering Department, California NanoSystems Institute, University of California, Los Angeles (UCLA), Los Angeles, CA USA., Balasubramaniam GM; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, 8410501 Beer-Sheva, Israel., Birnbaum T; Department of Electronics and Informatics (ETRO), Vrije Universiteit Brussel VUB), Pleinlaan 2, 1050 Brussel, Belgium.; Swave BV, Gaston Geenslaan 2, 3001 Leuven, Belgium., Bisht NS; Applied Optics and Spectroscopy Laboratory, Department of Physics, Soban Singh Jeena University Campus Almora, Almora, Uttarakhand 263601 India., Blinder D; Department of Electronics and Informatics (ETRO), Vrije Universiteit Brussel VUB), Pleinlaan 2, 1050 Brussel, Belgium.; IMEC, Kapeldreef 75, 3001 Leuven, Belgium.; Graduate School of Engineering, Chiba University, 1-33 Yayoi-cho, Inage-ku, Chiba, Chiba Japan., Cao L; Department of Precision Instruments, Tsinghua University, Beijing, 100084 China., Chen Q; Jiangsu Key Laboratory of Spectral Imaging and Intelligent Sense, Nanjing, 210094 Jiangsu China., Chen Z; Fujian Provincial Key Laboratory of Light Propagation and Transformation, College of Information Science and Engineering, Huaqiao University, Xiamen, 361021 Fujian China., Dubey V; Department of Physics and Technology, UiT The Arctic University of Norway, 9037 Tromsø, Norway., Egiazarian K; Computational Imaging Group, Faculty of Information Technology and Communication Sciences, Tampere University, 33100 Tampere, Finland., Ercan M; Institute of Materials Science and Nanotechnology, National Nanotechnology Research Center (UNAM), Bilkent University, 06800 Ankara, Turkey.; Department of Physics, Bilkent University, 06800 Ankara, Turkey., Forbes A; School of Physics, University of the Witwatersrand, Johannesburg, South Africa., Gopakumar G; Department of Computer Science and Engineering, Amrita School of Computing, Amrita Vishwa Vidyapeetham, Amritapuri, Vallikavu, Kerala India., Gao Y; Department of Precision Instruments, Tsinghua University, Beijing, 100084 China., Gigan S; Laboratoire Kastler Brossel, Centre National de la Recherche Scientifique (CNRS) UMR 8552, Sorbonne Universite ´, Ecole Normale Supe ´rieure-Paris Sciences et Lettres (PSL) Research University, Collège de France, 24 rue Lhomond, 75005 Paris, France., Gocłowski P; Department of Physics and Technology, UiT The Arctic University of Norway, 9037 Tromsø, Norway., Gopinath S; Institute of Physics, University of Tartu, W. Ostwaldi 1, 50411 Tartu, Estonia., Greenbaum A; Department of Biomedical Engineering, North Carolina State University and University of North Carolina at Chapel Hill, Raleigh, NC 27695 USA.; Comparative Medicine Institute, North Carolina State University, Raleigh, NC 27695 USA.; Bioinformatics Research Center, North Carolina State University, Raleigh, NC 27695 USA., Horisaki R; Graduate School of Information Science and Technology, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo, 113-8656 Japan., Ierodiaconou D; Faculty of Science Engineering and Built Environment, Deakin University, Princes Highway, Warrnambool, VIC 3280 Australia., Juodkazis S; Optical Sciences Center and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Computing and Engineering Technologies, Optical Sciences Center, Swinburne University of Technology, Hawthorn, Melbourne, VIC 3122 Australia.; World Research Hub Initiative (WRHI), Tokyo Institute of Technology, 2-12-1, Ookayama, Tokyo, 152-8550 Japan., Karmakar T; Laboratory of Information Photonics and Optical Metrology, Department of Physics, Indian Institute of Technology (Banaras Hindu University), Varanasi, Uttar Pradesh 221005 India., Katkovnik V; Computational Imaging Group, Faculty of Information Technology and Communication Sciences, Tampere University, 33100 Tampere, Finland., Khonina SN; IPSI RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia.; Samara National Research University, 443086 Samara, Russia., Kner P; School of Electrical and Computer Engineering, University of Georgia, Athens, GA 30602 USA., Kravets V; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, 8410501 Beer-Sheva, Israel., Kumar R; Department of Physics, SRM University - AP, Amaravati, Andhra Pradesh 522502 India., Lai Y; Laboratory of Applied Computational Imaging, Centre Énergie Matériaux Télécommunications, Institut National de la Recherche Scientifique, Université du Québec, Varennes, QC J3X1Pd7 Canada., Li C; Department of Biomedical Engineering, North Carolina State University and University of North Carolina at Chapel Hill, Raleigh, NC 27695 USA.; Comparative Medicine Institute, North Carolina State University, Raleigh, NC 27695 USA., Li J; Jiangsu Key Laboratory of Spectral Imaging and Intelligent Sense, Nanjing, 210094 Jiangsu China.; Smart Computational Imaging Laboratory (SCILab), School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, 210094 Jiangsu China.; Smart Computational Imaging Research Institute (SCIRI), Nanjing, 210019 Jiangsu China., Li S; School of Electrical and Computer Engineering, University of Georgia, Athens, GA 30602 USA., Li Y; Electrical and Computer Engineering Department, Bioengineering Department, California NanoSystems Institute, University of California, Los Angeles (UCLA), Los Angeles, CA USA., Liang J; Laboratory of Applied Computational Imaging, Centre Énergie Matériaux Télécommunications, Institut National de la Recherche Scientifique, Université du Québec, Varennes, QC J3X1Pd7 Canada., Manavalan G; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, 8410501 Beer-Sheva, Israel., Mandal AC; Laboratory of Information Photonics and Optical Metrology, Department of Physics, Indian Institute of Technology (Banaras Hindu University), Varanasi, Uttar Pradesh 221005 India., Manisha M; Laboratory of Information Photonics and Optical Metrology, Department of Physics, Indian Institute of Technology (Banaras Hindu University), Varanasi, Uttar Pradesh 221005 India., Mann C; Department of Applied Physics and Materials Science, Northern Arizona University, Flagstaff, AZ 86011 USA.; Center for Materials Interfaces in Research and Development, Northern Arizona University, Flagstaff, AZ 86011 USA., Marzejon MJ; Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 Sw. A. Boboli St., 02-525 Warsaw, Poland., Moodley C; School of Physics, University of the Witwatersrand, Johannesburg, South Africa., Morikawa J; World Research Hub Initiative (WRHI), Tokyo Institute of Technology, 2-12-1, Ookayama, Tokyo, 152-8550 Japan., Muniraj I; LiFE Lab, Department of Electronics and Communication Engineering, Alliance School of Applied Engineering, Alliance University, Bangalore, Karnataka 562106 India., Narbutis D; Institute of Theoretical Physics and Astronomy, Faculty of Physics, Vilnius University, Sauletekio 9, 10222 Vilnius, Lithuania., Ng SH; Optical Sciences Center and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Computing and Engineering Technologies, Optical Sciences Center, Swinburne University of Technology, Hawthorn, Melbourne, VIC 3122 Australia., Nothlawala F; School of Physics, University of the Witwatersrand, Johannesburg, South Africa., Oh J; Department of Physics, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141 South Korea.; KAIST Institute for Health Science and Technology, KAIST, Daejeon, 34141 South Korea., Ozcan A; Electrical and Computer Engineering Department, Bioengineering Department, California NanoSystems Institute, University of California, Los Angeles (UCLA), Los Angeles, CA USA., Park Y; Department of Physics, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141 South Korea.; KAIST Institute for Health Science and Technology, KAIST, Daejeon, 34141 South Korea.; Tomocube Inc., Daejeon, 34051 South Korea., Porfirev AP; IPSI RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia., Potcoava M; Department of Anatomy and Cell Biology, University of Illinois at Chicago, 808 South Wood Street, Chicago, IL 60612 USA., Prabhakar S; Quantum Science and Technology Laboratory, Physical Research Laboratory, Navrangpura, Ahmedabad, 380009 India., Pu J; Fujian Provincial Key Laboratory of Light Propagation and Transformation, College of Information Science and Engineering, Huaqiao University, Xiamen, 361021 Fujian China., Rai MR; Department of Biomedical Engineering, North Carolina State University and University of North Carolina at Chapel Hill, Raleigh, NC 27695 USA.; Comparative Medicine Institute, North Carolina State University, Raleigh, NC 27695 USA., Rogalski M; Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 Sw. A. Boboli St., 02-525 Warsaw, Poland., Ryu M; Research Institute for Material and Chemical Measurement, National Metrology Institute of Japan (AIST), 1-1-1 Umezono, Tsukuba, 305-8563 Japan., Choudhary S; Department Chemical Engineering, Ben-Gurion University of the Negev, 8410501 Beer-Shiva, Israel., Salla GR; Department of Physics, SRM University - AP, Amaravati, Andhra Pradesh 522502 India., Schelkens P; Department of Electronics and Informatics (ETRO), Vrije Universiteit Brussel VUB), Pleinlaan 2, 1050 Brussel, Belgium.; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Şener SF; Institute of Materials Science and Nanotechnology, National Nanotechnology Research Center (UNAM), Bilkent University, 06800 Ankara, Turkey.; Department of Physics, Bilkent University, 06800 Ankara, Turkey., Shevkunov I; Computational Imaging Group, Faculty of Information Technology and Communication Sciences, Tampere University, 33100 Tampere, Finland., Shimobaba T; Graduate School of Engineering, Chiba University, 1-33 Yayoi-cho, Inage-ku, Chiba, Chiba Japan., Singh RK; Laboratory of Information Photonics and Optical Metrology, Department of Physics, Indian Institute of Technology (Banaras Hindu University), Varanasi, Uttar Pradesh 221005 India., Singh RP; Quantum Science and Technology Laboratory, Physical Research Laboratory, Navrangpura, Ahmedabad, 380009 India., Stern A; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, 8410501 Beer-Sheva, Israel., Sun J; Jiangsu Key Laboratory of Spectral Imaging and Intelligent Sense, Nanjing, 210094 Jiangsu China.; Smart Computational Imaging Laboratory (SCILab), School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, 210094 Jiangsu China.; Smart Computational Imaging Research Institute (SCIRI), Nanjing, 210019 Jiangsu China., Zhou S; Jiangsu Key Laboratory of Spectral Imaging and Intelligent Sense, Nanjing, 210094 Jiangsu China.; Smart Computational Imaging Laboratory (SCILab), School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, 210094 Jiangsu China.; Smart Computational Imaging Research Institute (SCIRI), Nanjing, 210019 Jiangsu China., Zuo C; Jiangsu Key Laboratory of Spectral Imaging and Intelligent Sense, Nanjing, 210094 Jiangsu China.; Smart Computational Imaging Laboratory (SCILab), School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, 210094 Jiangsu China.; Smart Computational Imaging Research Institute (SCIRI), Nanjing, 210019 Jiangsu China., Zurawski Z; Department of Anatomy and Cell Biology, University of Illinois at Chicago, 808 South Wood Street, Chicago, IL 60612 USA., Tahara T; Applied Electromagnetic Research Center, Radio Research Institute, National Institute of Information and Communications Technology (NICT), 4-2-1 Nukuikitamachi, Koganei, Tokyo 184-8795 Japan., Tiwari V; Institute of Physics, University of Tartu, W. Ostwaldi 1, 50411 Tartu, Estonia., Trusiak M; Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 Sw. A. Boboli St., 02-525 Warsaw, Poland., Vinu RV; Fujian Provincial Key Laboratory of Light Propagation and Transformation, College of Information Science and Engineering, Huaqiao University, Xiamen, 361021 Fujian China., Volotovskiy SG; IPSI RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia., Yılmaz H; Institute of Materials Science and Nanotechnology, National Nanotechnology Research Center (UNAM), Bilkent University, 06800 Ankara, Turkey., De Aguiar HB; Laboratoire Kastler Brossel, Centre National de la Recherche Scientifique (CNRS) UMR 8552, Sorbonne Universite ´, Ecole Normale Supe ´rieure-Paris Sciences et Lettres (PSL) Research University, Collège de France, 24 rue Lhomond, 75005 Paris, France., Ahluwalia BS; Department of Physics and Technology, UiT The Arctic University of Norway, 9037 Tromsø, Norway., Ahmad A; Department of Physics and Technology, UiT The Arctic University of Norway, 9037 Tromsø, Norway.
Publikováno v:
Applied physics. B, Lasers and optics [Appl Phys B] 2024; Vol. 130 (9), pp. 166. Date of Electronic Publication: 2024 Aug 29.
Autor:
Gurbatov SO; Institute of Automation and Control Processes, Far Eastern Branch of RAS, Vladivostok 690041 Russia.; Far Eastern Federal University, Vladivostok 690950 Russia., Borodaenko YM; Institute of Automation and Control Processes, Far Eastern Branch of RAS, Vladivostok 690041 Russia., Mitsai EV; Institute of Automation and Control Processes, Far Eastern Branch of RAS, Vladivostok 690041 Russia., Modin E; CIC NanoGUNE BRTA, Avda Tolosa 76, 20018 Donostia-San Sebastian, Spain., Zhizhchenko AY; Institute of Automation and Control Processes, Far Eastern Branch of RAS, Vladivostok 690041 Russia., Cherepakhin AB; Institute of Automation and Control Processes, Far Eastern Branch of RAS, Vladivostok 690041 Russia., Shevlyagin AV; Institute of Automation and Control Processes, Far Eastern Branch of RAS, Vladivostok 690041 Russia., Syubaev SA; Institute of Automation and Control Processes, Far Eastern Branch of RAS, Vladivostok 690041 Russia.; IPSI RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia., Porfirev AP; IPSI RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia.; Scientific Research Laboratory of Automated Systems of Scientific Research, Samara National Research University, Samara 443086, Russia., Khonina SN; IPSI RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia.; Scientific Research Laboratory of Automated Systems of Scientific Research, Samara National Research University, Samara 443086, Russia., Yelisseyev AP; Laboratory of Crystal Growth, V.S. Sobolev Institute of Geology and Mineralogy SB RAS, Novosibirsk 630090, Russia.; Laboratory of Functional Materials, Novosibirsk State University, Novosibirsk 630090, Russia., Lobanov SI; Laboratory of Crystal Growth, V.S. Sobolev Institute of Geology and Mineralogy SB RAS, Novosibirsk 630090, Russia.; Laboratory of Functional Materials, Novosibirsk State University, Novosibirsk 630090, Russia., Isaenko LI; Laboratory of Crystal Growth, V.S. Sobolev Institute of Geology and Mineralogy SB RAS, Novosibirsk 630090, Russia.; Laboratory of Functional Materials, Novosibirsk State University, Novosibirsk 630090, Russia., Gurevich EL; Laser Center (LFM), University of Applied Sciences Münster, Stegerwaldstraße 39, 48565 Steinfurt, Germany., Kuchmizhak AA; Institute of Automation and Control Processes, Far Eastern Branch of RAS, Vladivostok 690041 Russia.
Publikováno v:
The journal of physical chemistry letters [J Phys Chem Lett] 2023 Oct 19; Vol. 14 (41), pp. 9357-9364. Date of Electronic Publication: 2023 Oct 11.
Autor:
Khorin PA; Samara National Research University, Samara 443086, Russia.; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, Samara 443001, Russia., Porfirev AP; Samara National Research University, Samara 443086, Russia.; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, Samara 443001, Russia., Khonina SN; Samara National Research University, Samara 443086, Russia.; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, Samara 443001, Russia.
Publikováno v:
Micromachines [Micromachines (Basel)] 2023 Apr 30; Vol. 14 (5). Date of Electronic Publication: 2023 Apr 30.
Autor:
Porfirev AP; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia., Ivliev NA; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia., Fomchenkov SA; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia., Khonina SN; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia.
Publikováno v:
Nanomaterials (Basel, Switzerland) [Nanomaterials (Basel)] 2023 Feb 03; Vol. 13 (3). Date of Electronic Publication: 2023 Feb 03.
Autor:
Porfirev AP; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia., Khonina SN; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia., Ivliev NA; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia., Fomchenkov SA; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia., Porfirev DP; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia., Karpeev SV; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2022 Dec 22; Vol. 23 (1). Date of Electronic Publication: 2022 Dec 22.
Publikováno v:
Optics letters [Opt Lett] 2022 Oct 01; Vol. 47 (19), pp. 5080-5083.
Autor:
Khorin PA; Department of Technical Cybernetics, Samara National Research University, 443086 Samara, Russia.; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia., Khonina SN; Department of Technical Cybernetics, Samara National Research University, 443086 Samara, Russia.; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia., Porfirev AP; Department of Technical Cybernetics, Samara National Research University, 443086 Samara, Russia.; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia., Kazanskiy NL; Department of Technical Cybernetics, Samara National Research University, 443086 Samara, Russia.; Image Processing Systems Institute of RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2022 Sep 28; Vol. 22 (19). Date of Electronic Publication: 2022 Sep 28.
Autor:
Doskolovich LL, Mingazov AA, Byzov EV, Skidanov RV, Ganchevskaya SV, Bykov DA, Bezus EA, Podlipnov VV, Porfirev AP, Kazanskiy NL
Publikováno v:
Optics express [Opt Express] 2021 Sep 27; Vol. 29 (20), pp. 31875-31890.
Publikováno v:
Optics express [Opt Express] 2021 Jun 07; Vol. 29 (12), pp. 18634-18645.