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pro vyhledávání: '"Poorvi K. Joshi"'
Autor:
Poorvi. K. Joshi, Meghana. A. Hasamnis
Publikováno v:
International Journal of Electrical and Electronics Engineering. 10:164-168
Publikováno v:
Materials Today: Proceedings. 73:200-210
Publikováno v:
Journal of Computational Electronics.
Autor:
Poorvi K. Joshi
Publikováno v:
HELIX. 10:01-05
MEMS resonators are important component in most of the RF applications. For reliable operation Quality factor should be high and important in transceivers for synchronizing and better sensitivity. This paper presents overview of work done in the area
Autor:
Poorvi K. Joshi
Publikováno v:
Journal of Physics: Conference Series. 2325:012013
Reliability study is required for all the industrial applications to understand the behavior and functionality of device with respect to technological, environmental and operational issues. This paper aim to study and analyzed the exiting contributio
Publikováno v:
Journal of Physics: Conference Series. 2325:012031
The collision of fishing vessels is the problem many fishermen face. Due to the lack of a proper system, this problem persists and inevitable danger needs to be solved. Even after detecting the objects that may collide with the ship, the captain may
Autor:
Poorvi K. Joshi, Meghana A. Hasamnis
Publikováno v:
MEMS Resonator Filters ISBN: 9781785618963
MEMS Resonator Filters
MEMS Resonator Filters
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::80b912c353cd23e56e1b300e3cf60252
https://doi.org/10.1049/pbcs065e_ch11
https://doi.org/10.1049/pbcs065e_ch11
Autor:
Poorvi K. Joshi
Publikováno v:
HELIX. 8:4345-4348
Autor:
Poorvi K. Joshi, Isha Sahu
Publikováno v:
International Journal of Computer Applications. 172:31-35
Autor:
Poorvi K. Joshi, Ajinkya Kapse
Publikováno v:
2016 International Conference on Advanced Communication Control and Computing Technologies (ICACCCT).
Due to limited number of pins, built-in self-test (BIST) for embedded Random Access Memories (RAMs) usually exports the diagnostic data serially, which increases the overall diagnostic time. The proposed BIST reduce the diagnostic time by reducing nu