Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Pollak, Marc"'
Publikováno v:
J. Appl. Phys. 97, 044302 (2005).
The Near-Field Microwave Microscope (NSMM) can be used to measure ohmic losses of metallic thin films. We report on the presence of a new length scale in the probe-to- sample interaction for the NSMM. We observe that this length scale plays an import
Externí odkaz:
http://arxiv.org/abs/cond-mat/0408218
Publikováno v:
Journal of Applied Physics; 2/15/2005, Vol. 97 Issue 4, p044302, 6p, 1 Black and White Photograph, 7 Graphs
Publikováno v:
Discover. Feb2008, Vol. 29 Issue 2, p8-8. 1p. 1 Color Photograph.