Zobrazeno 1 - 10
of 603
pro vyhledávání: '"Poelsema, Bene"'
Autor:
Kwiecinski, Wojciech, Sotthewes, Kai, Poelsema, Bene, Zandvliet, Harold J. W., Bampoulis, Pantelis
Publikováno v:
J. Colloid Interface Sci., 505 (2017) 776-782
Direct growth of flat micrometer-sized bilayer graphene islands in between molybdenum disulfide sheets is achieved by chemical vapor deposition of ethylene at about 800 {\deg}C. The temperature assisted decomposition of ethylene takes place mainly at
Externí odkaz:
http://arxiv.org/abs/1710.01061
Autor:
Bampoulis, Pantelis, Teernstra, Vincent J., Lohse, Detlef, Zandvliet, Harold J. W., Poelsema, Bene
Publikováno v:
J.Phys.Chem. C, 120 (40), 27079-27084 (2016)
The structure and nature of water confined between hydrophobic molybdenum disulfide (MoS2) and graphene (Gr) are investigated at room temperature by means of atomic force microscopy. We find the formation of two-dimensional (2D) crystalline ice layer
Externí odkaz:
http://arxiv.org/abs/1706.00675
Autor:
Jankowski, Maciej, van Vroonhoven, Esther, Wormeester, Herbert, Zandvliet, Harold J. W., Poelsema, Bene
Publikováno v:
J. Phys. Chem. C, 2017, 121 (15), 8353-8363
An in-situ nanoscopic investigation of the prototypical surface alloying system Ag/Pt(111) is reported. The morphology and the structure of the ultrathin Ag-Pt film is studied using Low Energy Electron Microscopy during growth at about 800 K. An amaz
Externí odkaz:
http://arxiv.org/abs/1611.06354
Autor:
Bampoulis, Pantelis, Siekman, Martin H., Kooij, E. Stefan, Lohse, Detlef, Zandvliet, Harold J. W., Poelsema, Bene
Publikováno v:
J. Chem. Phys. 143, 034702 (2015)
The basic science responsible for the fascinating shapes of ice crystals and snowflakes is still not understood. Insufficient knowledge of the interaction potentials and the lack of relevant experimental access to the growth process are to blame for
Externí odkaz:
http://arxiv.org/abs/1604.07168
Autor:
Hlawacek, Gregor, Jankowski, Maciej, Wormeester, Herbert, van Gastel, Raoul, Zandvliet, Harold J. W., Poelsema, Bene
Publikováno v:
Ultramicroscopy 162 (2016) 17-24
Helium Ion Microscopy is known for its surface sensitivity and high lateral resolution. Here, we present results of a Helium Ion Microscopy based investigation of a surface confined alloy of Ag on Pt(111). Based on a change of the work function of 25
Externí odkaz:
http://arxiv.org/abs/1505.00020
Publikováno v:
Journal of Vacuum Science and Technology B 32(2), 020801 (2014)
Helium Ion Microcopy (HIM) based on Gas Field Ion Sources (GFIS) represents a new ultra high resolution microscopy and nano-fabrication technique. It is an enabling technology that not only provides imagery of conducting as well as uncoated insulatin
Externí odkaz:
http://arxiv.org/abs/1311.1711
Autor:
Khokhar, Fawad S., Hlawacek, Gregor, van Gastel, Raoul, Zandvliet, Harold J. W., Teichert, Christian, Poelsema, Bene
Publikováno v:
Surface Science, Volume 606, Issues 3-4, February 2012, Pages 475-480
The growth of para-sexiphenyl (6P) thin films as a function of substrate temperature on Ir{111} supported graphene flakes has been studied in real-time with Low Energy Electron Microscopy (LEEM). Micro Low Energy Electron Diffraction (\mu LEED) has b
Externí odkaz:
http://arxiv.org/abs/1107.0373
Autor:
Seddon, James R. T., Kooij, E. Stefan, Poelsema, Bene, Zandvliet, Harold J. W., Lohse, Detlef
Publikováno v:
Phys. Rev. Lett. 106, 056101 (2011)
Recent research has revealed several different techniques for nanoscopic gas nucleation on submerged surfaces, with findings seemingly in contradiction with each other. In response to this, we have systematically investigated the occurrence of surfac
Externí odkaz:
http://arxiv.org/abs/1011.1786
Autor:
N'Diaye, Alpha T., van Gastel, Raoul, Martinez-Galera, Antonio J., Coraux, Johann, Hattab, Hichem, Wall, Dirk, Heringdorf, Frank-J. Meyer zu, Hoegen, Michael Horn-von, Gomez-Rodriguez, Jose M., Poelsema, Bene, Busse, Carsten, Michely, Thomas
Upon cooling, branched line defects develop in epitaxial graphene grown at high temperature on Pt(111) and Ir(111). Using atomically resolved scanning tunneling microscopy we demonstrate that these defects are wrinkles in the graphene layer, i.e. str
Externí odkaz:
http://arxiv.org/abs/0906.0896