Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Po-Lun Chou"'
Autor:
Po-Lun Chou, 周博倫
100
In this research, a method of 3D environmental reconstruction is proposed and it used the block-based stereo matching and Back-Propagation Neural Network (BPNN) with binocular stereo vision for outdoor Autonomous Land Vehicle (ALV) guidance.
In this research, a method of 3D environmental reconstruction is proposed and it used the block-based stereo matching and Back-Propagation Neural Network (BPNN) with binocular stereo vision for outdoor Autonomous Land Vehicle (ALV) guidance.
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/qnsxau
Autor:
Po-Lun Chou, 邱柏倫
100
Wafer-Level Chip-Scale Packages (WLCSP) have become more and more popular due to their light-weights and small sizes. To reduce time-to-market of a product as well as its development cost, the electronics industry often employs accelerated t
Wafer-Level Chip-Scale Packages (WLCSP) have become more and more popular due to their light-weights and small sizes. To reduce time-to-market of a product as well as its development cost, the electronics industry often employs accelerated t
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/60129289526364575412
Autor:
John Lavelle, Chad Ellimoottil, Ziya Kirkali, Julia S. Barthold, Lei Sandy Ye, Po-Lun Chou, Zhihang Lin, Myrna Cozen, Kyle Buika, John Hornberger
Publikováno v:
Journal of Urology. 209
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::617f5b051ad6c7c59ebadee8abb50c04
https://doi.org/10.1097/ju.0000000000003294.16
https://doi.org/10.1097/ju.0000000000003294.16
Publikováno v:
2012 14th International Conference on Electronic Materials and Packaging (EMAP).
Finite element analysis (FEA) is employed frequently in studying the reliability of electronic packing. In real practice of electronics industry, accelerated life testing (ALT) has also been employed extensively on finding the life and reliability of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bab3850a86b8f26c7da1f316d3298065
https://doi.org/10.1109/emap.2012.6507914
https://doi.org/10.1109/emap.2012.6507914