Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Po-Juei Chen"'
Autor:
Po-Juei Chen, 陳柏瑞
102
Systematic defects and small delay defects (SDD) have become key challenges of yield and reliability due to shrinking geometry and increasing frequency in advanced technology. For yield and reliability improvement, physical failure analysis
Systematic defects and small delay defects (SDD) have become key challenges of yield and reliability due to shrinking geometry and increasing frequency in advanced technology. For yield and reliability improvement, physical failure analysis
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/78137273623163995987
Autor:
Shuo-Fen Kuo, Jih-Nung Lee, Po-Juei Chen, James Chien-Mo Li, Chun-Yi Kuo, Pei-Ying Hsueh, Chieh-Chih Che
Publikováno v:
IET Computers & Digital Techniques. 8:199-209
This study presents a systematic defect diagnosis to identify ‘culprit physical features’ that are potentially responsible for yield loss. A ‘single location in-a-cluster’ technique is proposed to diagnose multiple defects that may not be dia
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e4692d11359fed32aaebda9769ff840b
https://doi.org/10.1049/iet-cdt.2013.0104
https://doi.org/10.1049/iet-cdt.2013.0104
Autor:
James Chien-Mo Li, Shih-Min Chao, Po-Hao Chen, Ying-Yen Chen, Po-Juei Chen, Ang-Feng Lin, Pei-Ying Hsueh, Chun-Yi Kuo, Jing-Yu Chen, Jih-Nung Li
Publikováno v:
ITC
This paper presents a novel diagnosis technique for multiple defects. This technique proposes a simple heuristic to partition the failures log so that hard-to-detect defects and easy-to-detect defects are likely to be separated. This technique requir
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff9187ebf194c1eda8bcbab90d0148d1
https://doi.org/10.1109/test.2014.7035362
https://doi.org/10.1109/test.2014.7035362
Autor:
Michael S. Hsiao, James Chien-Mo Li, Kuan-Yu Liao, Po-Juei Chen, Ang-Feng Lin, Laung-Terng Wang
Publikováno v:
ETS
A GPU-based timing-aware ATPG is proposed to generate a compact high-quality test set. The test generation algorithm backtraces and propagates along multiple long paths so that many test patterns are generated at the same time. Generated test pattern
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ae5ef17c53250bbeaf9daf93d80cd9e8
https://doi.org/10.1109/ets.2014.6847835
https://doi.org/10.1109/ets.2014.6847835
Autor:
Nan-Hsin Tseng, James Chien-Mo Li, Wei-Li Hsu, Kuo-Yin Chen, Wei-Pin Changchien, Charles C. C. Liu, Po-Juei Chen
Publikováno v:
Asian Test Symposium
This paper presents a novel diagnosis algorithm for small delay defects (SDD). Faster-than-at-speed test sets are generated by masking long paths in the circuit for testing SDD. The proposed diagnosis technique uses timing upper and lower bound to im
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c247b71c67e9f97f4f3fc4be3aa5bfb6
https://doi.org/10.1109/ats.2011.23
https://doi.org/10.1109/ats.2011.23
Publikováno v:
Asian Test Symposium
Diagnosis for systematic defects is very critical for yield learning in nanometer technology. This paper presents a bridging fault diagnosis which identifies a single layer of systematic defects (LSD), where more than expected numbers of bridging fau
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a2a3658413a46b0817e640aa671cd7ff
https://doi.org/10.1109/ats.2009.58
https://doi.org/10.1109/ats.2009.58
Autor:
Po-Juei Chen, Wei-Li Hsu, Li, J.C.-M., Nan-Hsin Tseng, Kuo-Yin Chen, Wei-pin Changchien, Liu, C.C.C.
Publikováno v:
2011 20th Asian Test Symposium (ATS); 2011, p291-296, 6p
Publikováno v:
2009 Asian Test Symposium; 2009, p349-354, 6p