Výsledky vyhledávání - "Po-Juei Chen"

Physical‐aware systematic multiple defect diagnosis

Autor: Shuo-Fen Kuo, Jih-Nung Lee, Po-Juei Chen, James Chien-Mo Li, Chun-Yi Kuo, Pei-Ying Hsueh, Chieh-Chih Che

Publikováno v: IET Computers & Digital Techniques. 8:199-209

This study presents a systematic defect diagnosis to identify ‘culprit physical features’ that are potentially responsible for yield loss. A ‘single location in-a-cluster’ technique is proposed to diagnose multiple defects that may not be dia

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e4692d11359fed32aaebda9769ff840b
https://doi.org/10.1049/iet-cdt.2013.0104

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Divide and conquer diagnosis for multiple defects

Autor: James Chien-Mo Li, Shih-Min Chao, Po-Hao Chen, Ying-Yen Chen, Po-Juei Chen, Ang-Feng Lin, Pei-Ying Hsueh, Chun-Yi Kuo, Jing-Yu Chen, Jih-Nung Li

Publikováno v: ITC

This paper presents a novel diagnosis technique for multiple defects. This technique proposes a simple heuristic to partition the failures log so that hard-to-detect defects and easy-to-detect defects are likely to be separated. This technique requir

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::ff9187ebf194c1eda8bcbab90d0148d1
https://doi.org/10.1109/test.2014.7035362

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GPU-based timing-aware test generation for small delay defects

Autor: Michael S. Hsiao, James Chien-Mo Li, Kuan-Yu Liao, Po-Juei Chen, Ang-Feng Lin, Laung-Terng Wang

Publikováno v: ETS

A GPU-based timing-aware ATPG is proposed to generate a compact high-quality test set. The test generation algorithm backtraces and propagates along multiple long paths so that many test patterns are generated at the same time. Generated test pattern

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::ae5ef17c53250bbeaf9daf93d80cd9e8
https://doi.org/10.1109/ets.2014.6847835

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Dissertation/ Thesis

Physical-aware and Timing-aware Diagnosis for Systematic Defects and Small Delay Defects in Advanced Technology

Autor: Po-Juei Chen, 陳柏瑞

102
Systematic defects and small delay defects (SDD) have become key challenges of yield and reliability due to shrinking geometry and increasing frequency in advanced technology. For yield and reliability improvement, physical failure analysis

Externí odkaz: http://ndltd.ncl.edu.tw/handle/78137273623163995987

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An Accurate Timing-Aware Diagnosis Algorithm for Multiple Small Delay Defects

Autor: Nan-Hsin Tseng, James Chien-Mo Li, Wei-Li Hsu, Kuo-Yin Chen, Wei-Pin Changchien, Charles C. C. Liu, Po-Juei Chen

Publikováno v: Asian Test Symposium

This paper presents a novel diagnosis algorithm for small delay defects (SDD). Faster-than-at-speed test sets are generated by masking long paths in the circuit for testing SDD. The proposed diagnosis technique uses timing upper and lower bound to im

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::c247b71c67e9f97f4f3fc4be3aa5bfb6
https://doi.org/10.1109/ats.2011.23

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Bridging Fault Diagnosis to Identify the Layer of Systematic Defects

Autor: Hsing Jasmine Chao, Po-Juei Chen, James Chien-Mo Li

Publikováno v: Asian Test Symposium

Diagnosis for systematic defects is very critical for yield learning in nanometer technology. This paper presents a bridging fault diagnosis which identifies a single layer of systematic defects (LSD), where more than expected numbers of bridging fau

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::a2a3658413a46b0817e640aa671cd7ff
https://doi.org/10.1109/ats.2009.58

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