Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Po-Feng Chen"'
Autor:
Jung-Chuan Chou, Po-Feng Chen, Po-Hui Yang, Chih-Hsien Lai, Po-Yu Kuo, Yu-Hsun Nien, Shang-Wen Zhuang, Ruei-Hong Syu, Yu-Han Huang
Publikováno v:
IEEE Access, Vol 11, Pp 98082-98092 (2023)
In this study, the titanium dioxide (TiO2) thin film prepared by radio frequency magnetron sputtering system (R.F. sputtering) was used as the blocking layer (BL) of DSSCs. TiO2 blocking layer (TBL) is used to reduce the recombination reaction caused
Externí odkaz:
https://doaj.org/article/6ebe7289420b4f6cbaa7ce2cbffd96fb
Autor:
Po-Feng Chen, 陳柏風
105
The purpose of this study is to explore the influencing factors of promotion strategy, service quality, and corporate image on purchase intention of consumers. The empirical variables include main variables (i.e., purchase intention, promoti
The purpose of this study is to explore the influencing factors of promotion strategy, service quality, and corporate image on purchase intention of consumers. The empirical variables include main variables (i.e., purchase intention, promoti
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/xnzqfv
Autor:
Po-feng Chen, 陳渤丰
98
The growth of the heterotrophic plate count in distribution system, causing deterioration of drinking water quality, is called biological re-growth or after-growth. There are many methods to solve above problems such as disinfecting and washi
The growth of the heterotrophic plate count in distribution system, causing deterioration of drinking water quality, is called biological re-growth or after-growth. There are many methods to solve above problems such as disinfecting and washi
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/19139377896238664797
Autor:
Po-Feng Chen, 陳柏楓
94
This research create the cause-effect model of leadership, organizational culture, organizational learning, job satisfaction, organizational commitment and the organizational performance. Then, through the application of SEM, probe into the l
This research create the cause-effect model of leadership, organizational culture, organizational learning, job satisfaction, organizational commitment and the organizational performance. Then, through the application of SEM, probe into the l
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/52495000334164923679
Autor:
Jung-Chuan Chou, Po-Feng Chen, Po-Hui Yang, Chih-Hsien Lai, Po-Yu Kuo, Yu-Hsun Nien, Ruei-Hong Syu, Yi-Ting Wu, Shang-Wen Zhuang
Publikováno v:
IEEE Transactions on Electron Devices. 70:2415-2423
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cf28d04ea68456af1d9fea0d96e34172
https://doi.org/10.1109/ted.2023.3258402
https://doi.org/10.1109/ted.2023.3258402
Autor:
Yu-Hsun Nien, Shang-Wen Zhuang, Jung-Chuan Chou, Po-Hui Yang, Chih-Hsien Lai, Po-Yu Kuo, Chih-Sung Ho, Yi-Ting Wu, Ruei-Hong Syu, Po-Feng Chen
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 36:291-297
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::74eb94312c57775011f5347eb17701ae
https://doi.org/10.1109/tsm.2023.3235762
https://doi.org/10.1109/tsm.2023.3235762
Autor:
Jung-Chuan Chou, Jun-Xiang Chang, Po-Hui Yang, Ruei-Hong Syu, Chih-Hsien Lai, Po-Yu Kuo, Yu-Hsun Nien, Yu-Che Lin, Po-Feng Chen, Shang-Wen Zhuang
Publikováno v:
IEEE Journal of Photovoltaics. 13:87-94
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c3cd020e46d9e1ea83b52c0613239973
https://doi.org/10.1109/jphotov.2022.3229189
https://doi.org/10.1109/jphotov.2022.3229189
Autor:
Jung-Chuan Chou, Ruei-Hong Syu, Po-Hui Yang, Po-Yu Kuo, Yu-Hsun Nien, Chih-Hsien Lai, Po-Feng Chen, Yi-Ting Wu, Shang-Wen Zhuang
Publikováno v:
IEEE Transactions on Nanotechnology. 22:20-27
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::60de44c71db400493299636b8d94e6b5
https://doi.org/10.1109/tnano.2023.3235335
https://doi.org/10.1109/tnano.2023.3235335
Autor:
Tzu-En Lin, Ming-Chun Chien, Po-Feng Chen, Pei-Wen Yang, Huai-En Chang, Ding-Han Wang, Tung-Yi Lin, Yung-Jung Hsu
Publikováno v:
ACS Omega. 7:42233-42241
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e4b79440ab3531b586753556a2f61fbc
https://doi.org/10.1021/acsomega.2c04655
https://doi.org/10.1021/acsomega.2c04655
Autor:
Jung-Chuan Chou, Ruei-Hong Syu, Po-Hui Yang, Po-Yu Kuo, Yu-Hsun Nien, Chih-Hsien Lai, Po-Feng Chen, Yi-Ting Wu, Shang-Wen Zhuang
Publikováno v:
IEEE Transactions on Electron Devices. 69:5004-5011
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::315455d2e2c87a7b8113e4b04113ea6d
https://doi.org/10.1109/ted.2022.3188600
https://doi.org/10.1109/ted.2022.3188600