Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Plotnikov Artem"'
Publikováno v:
E3S Web of Conferences, Vol 376, p 03001 (2023)
The main issue highlighted in the given paper is deviation of microclimate parameters from regulatory values due to improper distribution of air flows in living rooms of blocks of flats. The present work is aimed at obtaining a working mathematical m
Externí odkaz:
https://doaj.org/article/81433a3cc70b498caa694586e400a7f7
Publikováno v:
E3S Web of Conferences, Vol 164, p 03011 (2020)
The aim of the present work is to develop a model of grooving corrosion of the pipeline using APM WinMachine program. Corrosion is caused by chemical reaction of the metal with the environment (outside) and the transported product (inside) undergoing
Externí odkaz:
https://doaj.org/article/b6e52a16c1314870bb8296522eed5fc2
Autor:
Zheltenkov, A., Mottaeva, A., Zhilina, Tatiana, Afonin, Konstantin, Mironov, Victor, Plotnikov, Artem, Shapoval, Anatoly
Publikováno v:
E3S Web of Conferences; 4/18/2020, Vol. 164, p1-7, 7p
Autor:
Kubryakov, Arseny1 (AUTHOR) annete08@mail.ru, Aleskerova, Anna1 (AUTHOR), Plotnikov, Evgeniy1 (AUTHOR), Mizyuk, Artem1 (AUTHOR), Medvedeva, Alesya1 (AUTHOR), Stanichny, Sergey1 (AUTHOR)
Publikováno v:
Remote Sensing. Sep2023, Vol. 15 Issue 18, p4386. 24p.
Autor:
Berseneva, Aleksandra1 (AUTHOR), Kovalenko, Elena2 (AUTHOR), Vergasova, Ekaterina2 (AUTHOR), Prohorov, Aleksandr2 (AUTHOR), Popov, Iaroslav2 (AUTHOR), Ilinskaya, Anna2 (AUTHOR), Kim, Anna2 (AUTHOR), Plotnikov, Nikolay2 (AUTHOR), Elmuratov, Artem2 (AUTHOR), Ilinsky, Valery2 (AUTHOR), Rakitko, Alexander2 (AUTHOR) rakitko@genotek.ru
Publikováno v:
European Journal of Clinical Nutrition. May2023, Vol. 77 Issue 5, p574-578. 5p.
Publikováno v:
IEEE Sensors Journal; Dec2020, Vol. 20 Issue 23, p14202-14208, 7p
Publikováno v:
2014 15th International Conference of Young Specialists on Micro/Nanotechnologies & Electron Devices (EDM); 2014, piii-viii, 6p
Publikováno v:
2014 15th International Conference of Young Specialists on Micro/Nanotechnologies & Electron Devices (EDM); 2014, p399-402, 4p
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