Zobrazeno 1 - 10
of 94
pro vyhledávání: '"Platz, Daniel"'
The coupling of micro- or nanomechanical resonators via a shared substrate is intensively exploited to built systems for fundamental studies and practical applications. So far, the focus has been on devices operating in the kHz regime with a spring-l
Externí odkaz:
http://arxiv.org/abs/2006.14862
Publikováno v:
In Sensors and Actuators: A. Physical 1 November 2023 362
Autor:
Platz, Daniel
High-quality factor oscillators are often used in measurements of verysmall force since they exhibit an enhanced sensitivity in the narrow frequencyband around resonance. Forces containing frequencies outside this frequencyband are often not detectab
Externí odkaz:
http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-122583
Publikováno v:
Nanotechnology 25 485708 (2014)
Conventional dynamic atomic force microscopy (AFM) can be extended to bimodal and multimodal AFM in which the cantilever is simultaneously excited at two ore more resonance frequencies. Such excitation schemes result in one additional amplitude and p
Externí odkaz:
http://arxiv.org/abs/1407.4319
Autor:
Borysov, Stanislav S., Platz, Daniel, de Wijn, Astrid S., Forchheimer, Daniel, Tolen, Eric A., Balatsky, Alexander V., Haviland, David B.
Publikováno v:
Phys. Rev. B 88, 115405 (2013)
We propose a theoretical framework for reconstructing tip-surface interactions using the intermodulation technique when more than one eigenmode is required to describe the cantilever motion. Two particular cases of bimodal motion are studied numerica
Externí odkaz:
http://arxiv.org/abs/1305.0167
We demonstrate quantitative force imaging of long-range magnetic forces simultaneously with near-surface van-der-Waals and contact-mechanics forces using intermodulation atomic force microscopy. Magnetic forces at the 200 pN level are separated from
Externí odkaz:
http://arxiv.org/abs/1303.2134
Publikováno v:
ASME Conference Proceedings 2010, 449 (2010)
We perform simulations and experiments on an oscillating atomic force microscope cantilever approaching a surface, where the intermodulation response of the cantilever driven with two pure harmonic tones is investigated. In the simulations, the tip a
Externí odkaz:
http://arxiv.org/abs/1302.5639
We present polynomial force reconstruction from experimental intermodulation atomic force microscopy (ImAFM) data. We study the tip-surface force during a slow surface approach and compare the results with amplitude-dependence force spectroscopy. Bas
Externí odkaz:
http://arxiv.org/abs/1302.1829
Publikováno v:
Beilstein Journal of Nanotechnology 4, 45-56 (2013)
Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip-surface force by measurement of the mixing of multiple tones in a frequency comb. A high $Q$ cantilever resonance and a suitabl
Externí odkaz:
http://arxiv.org/abs/1302.1140
In atomic force microscopy (AFM) tip-surface interactions are usually considered as functions of the tip position only, so-called force curves. However, tip-surface interactions often depend on the tip velocity and the past tip trajectory. Here, we i
Externí odkaz:
http://arxiv.org/abs/1301.7340