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NexusLIMS: A Laboratory Information Management System for Shared-Use Electron Microscopy Facilities.
Autor:
Taillon JA; Office of Data and Informatics, Material Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO80305, USA., Bina TF; Materials Science and Engineering Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD20899, USA.; Office of Data and Informatics, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD20899, USA., Plante RL; Office of Data and Informatics, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD20899, USA., Newrock MW; Office of Data and Informatics, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD20899, USA., Greene GR; Office of Data and Informatics, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD20899, USA., Lau JW; Materials Science and Engineering Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD20899, USA.
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2021 Apr 28, pp. 1-17. Date of Electronic Publication: 2021 Apr 28.
Autor:
Plante RL; National Institute of Standards and Technology, Material Measurement Laboratory, Office of Data and Informatics, Gaithersburg, MD, United States of America., Becker CA; National Institute of Standards and Technology, Material Measurement Laboratory, Office of Data and Informatics, Gaithersburg, MD, United States of America., Medina-Smith A; National Institute of Standards and Technology, Information Services Office, Gaithersburg, MD, United States of America., Brady K; National Institute of Standards and Technology, Information Technology Laboratory, Gaithersburg, MD, United States of America., Dima A; National Institute of Standards and Technology, Information Technology Laboratory, Gaithersburg, MD, United States of America., Long B; National Institute of Standards and Technology, Information Technology Laboratory, Gaithersburg, MD, United States of America., Bartolo LM; Northwestern University, Center for Hierarchical Materials Design, Evanston, IL, United States of America., Warren JA; National Institute of Standards and Technology, Material Measurement Laboratory, Gaithersburg, MD, United States of America., Hanisch RJ; National Institute of Standards and Technology, Material Measurement Laboratory, Office of Data and Informatics, Gaithersburg, MD, United States of America.
Publikováno v:
Data science journal [Data Sci J] 2021; Vol. 20.
Autor:
Taillon JA; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MD USA., Devers RF; Department of Electrical and Computer Engineering, University of Maryland, College Park, MD USA., Plante RL; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MD USA., Newrock MW; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MD USA., Lau JW; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MD USA., Greene G; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MD USA.
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2019 Aug; Vol. 25 (Suppl 2), pp. 140-141.