Chemical and physical understanding of diffusion barrier layers on semiconductors: (hfac)copper(VTMS) and its ligands on silicon(100)-2 x 1 and titanium carbon nitride-covered silicon

Autor: Pirolli, Laurent.

Publikováno v: Access to citation, abstract and download form provided by ProQuest Information and Learning Company; downloadable PDF file 3.19 Mb., 254 p.

Thesis (Ph. D.)--University of Delaware, 2006.
Principal faculty advisor: Andrew V. Teplyakov, Dept. of Chemistry & Biochemistry and Raul F. Lobo, Dept. of Chemical Engineering. Includes bibliographical references.

Externí odkaz: http://proquest.umi.com/pqdlink?did=1179959861&Fmt=7&clientId=8331&RQT=309&VName=PQD

Structurally different interfaces between electrospark-deposited titanium carbonitride and tungsten carbide films on steel

Autor: Miller, Timothy, Pirolli, Laurent, Deng, Fei, Ni, Chaoying, Teplyakov, Andrew V.

Publikováno v: In Surface & Coatings Technology 15 November 2014 258:814-821

Effect of film thickness and the presence of surface fluorine on the structure of a thin barrier film deposited from tetrakis-(dimethylamino)-titanium onto a Si(100)-2 × 1 substrate

Autor: Ni, Chaoying, Zhang, Zhanping, Wells, Matthew, Beebe, Thomas P., Jr., Pirolli, Laurent, Méndez De Leo, Lucila P., Teplyakov, Andrew V.

Publikováno v: In Thin Solid Films 2007 515(5):3030-3039

Molecular view of copper deposition chemistry: (Hexafluoroacetylacetonate)Cu(vinyltrimethylsilane) on a Si(1 0 0)-2 × 1 surface

Autor: Pirolli, Laurent, Teplyakov, Andrew V.

Publikováno v: In Surface Science 2006 600(16):3313-3320

Chapter 2 - Conventional Oil and Gas

Autor: Goodwin, Anthony R.H., Pirolli, Laurent, May, Eric F., Marsh, Kenneth N.

Publikováno v: In Future Energy Edition: Second Edition. 2014:19-52