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DDECS
In the paper, two methods of ensuring high quality of the memory built-in self-test tools are presented. The described ideas illustrate general methods and are applicable to any commercial memory BIST tool. The first solution describes controller emu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::81f2f80f323be54205e7161f887ccbc4
https://doi.org/10.1109/ddecs.2014.6868760
https://doi.org/10.1109/ddecs.2014.6868760
