Zobrazeno 1 - 10
of 30
pro vyhledávání: '"Piotr Kunicki"'
Autor:
Bartosz Pruchnik, Krzysztof Kwoka, Ewelina Gacka, Dominik Badura, Piotr Kunicki, Andrzej Sierakowski, Paweł Janus, Tomasz Piasecki, Teodor Gotszalk
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 15, Iss 1, Pp 1273-1282 (2024)
Focused electron beam-induced deposition (FEBID) is a novel technique for the development of multimaterial nanostructures. More importantly, it is applicable to the fabrication of free-standing nanostructures. Experimenting at the nanoscale requires
Externí odkaz:
https://doaj.org/article/363290fd39664ea693adb047698c3626
Publikováno v:
Sensors, Vol 19, Iss 20, p 4429 (2019)
This paper presents a comprehensive modeling and experimental verification of active piezoresistive atomic force microscopy (AFM) cantilevers, which are the technology enabling high-resolution and high-speed surface measurements. The mechanical struc
Externí odkaz:
https://doaj.org/article/f0c658eb48f2494fa1e43a03cd581834
Autor:
Piotr Kunicki
Publikováno v:
Studia Prawnicze / The Legal Studies. :191-219
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::14618b7ed8786fe9cc83fcbb936ba2a3
https://doi.org/10.37232/sp.2010.3-4.5
https://doi.org/10.37232/sp.2010.3-4.5
Autor:
Ewelina Gacka, Piotr Kunicki, Paulina Łysik, Krzysztof Gajewski, Paulina Ciechanowicz, Damian Pucicki, Dominika Majchrzak, Teodor Gotszalk, Tomasz Piasecki, Tito Busani, Ivo W. Rangelow, Detlef Hommel
Publikováno v:
Ultramicroscopy. 248:113713
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2a14b89964feba310441d79568c4e946
https://doi.org/10.1016/j.ultramic.2023.113713
https://doi.org/10.1016/j.ultramic.2023.113713
Autor:
Piotr Niedzielski, W. Kaczorowski, Sami Ramadan, Krzysztof Gajewski, Norbert Klein, Andrzej Sierakowski, Ling Hao, Olena Shaforost, Witold Szymanski, Teodor Gotszalk, Piotr Kunicki
Publikováno v:
Microelectronic Engineering. 212:1-8
Here we present an approach to measure the surface potential distribution of specimens using scanning tunnelling potentiometry with high potential gradients and relatively low sample bias. A special design of test structures containing pre-patterned
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d3349c1e178f4c98297ec700623e8ff
https://doi.org/10.1016/j.mee.2019.03.023
https://doi.org/10.1016/j.mee.2019.03.023
Publikováno v:
Applied Surface Science. 470:331-339
Over 10 days of exposure in 0.05 M NaCl solution, Ni coating with mean crystallite size of 6 nm deposited in ChCl:EG deep eutectic solvent corrodes with diffusion constraints. Native oxide layer (4.7 nm thick) is a mixture of NiO and NiOOH. During ex
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fd3f0835046a7cf542217cc4472b78a5
https://doi.org/10.1016/j.apsusc.2018.11.155
https://doi.org/10.1016/j.apsusc.2018.11.155
Autor:
Karolina Orłowska, Wojciech Majstrzyk, Daniel Tomaszewski, Piotr Kunicki, Piotr Prokaryn, Piotr Grabiec, Teodor Gotszalk, Andrzej Sierakowski, Bartosz Pruchnik
Publikováno v:
Microelectronic Engineering. 201:10-15
Radiation pressure – RP phenomenon has drawn much interest since the beginning of the 20th century. There are many technologies linked with it and worth mentioning: cavity optomechanics with optical cooling and small forces amplification, single at
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::663c60af876b0377ec8f31734a038a1b
https://doi.org/10.1016/j.mee.2018.09.003
https://doi.org/10.1016/j.mee.2018.09.003
Autor:
Ewelina Gacka, Piotr Kunicki, Andrzej Sikora, Robert Bogdanowicz, Mateusz Ficek, Teodor Gotszalk, Ivo W. Rangelow, Krzysztof Kwoka
Publikováno v:
Measurement. 191:110828
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e7b6fb13dff6919ccdfd881a111db6c9
https://doi.org/10.1016/j.measurement.2022.110828
https://doi.org/10.1016/j.measurement.2022.110828
Publikováno v:
Nanotechnology. 31(42)
Atomic force microscopy (AFM) belongs to the high resolution and high sensitivity surface imaging technologies. In this method force interactions between the tip and the surface are observed to characterize sample properties. In the so-called contact
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2502fc877d546a3568b208a609ad0b4d
https://pubmed.ncbi.nlm.nih.gov/32599567
https://pubmed.ncbi.nlm.nih.gov/32599567
Autor:
Tomasz Piasecki, Wojciech Majstrzyk, Teodor Gotszalk, Tomasz Dąbrowa, Włodzimierz Więckiewicz, Piotr Kunicki, Magdalena Tamulewicz
Publikováno v:
Acta of bioengineering and biomechanics. 21(4)
PURPOSE The surface roughness of the dental restorations is significant to the denture plaque adhesion. METHODS In this work, we present the complex analysis of the electropolished CoCrW alloy remanium® star (Dentaurum, Germany) samples with laseren
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fb38f795485e51095be8e0da2a4797e3
https://pubmed.ncbi.nlm.nih.gov/32022795
https://pubmed.ncbi.nlm.nih.gov/32022795