Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Pintar AL"'
Autor:
Krstić Sanja S., Kragović Milan M., Dodevski Vladimir M., Marinković Aleksandar D., Kaluđerović Branka V., Žerjav Gregor, Pintar Albin, Pagnacco Maja C., Stojmenović Marija D.
Publikováno v:
Science of Sintering, Vol 50, Iss 2, Pp 255-273 (2018)
In presented paper, influence of temperature, precursor concentration and different hydroxides on properties of activated carbon obtained from saccharose were investigated. The samples were prepared by hydrothermal treatment and activated using KO
Externí odkaz:
https://doaj.org/article/1edc3b5f34374abeb669b27ca78f25e1
Publikováno v:
Open Chemistry, Vol 10, Iss 4, Pp 1137-1148 (2012)
Externí odkaz:
https://doaj.org/article/8e67093c65924f4db83a77b20afb81be
Publikováno v:
Biology Direct, Vol 2, Iss 1, p 19 (2007)
Abstract The cytoplasmic tail of Notch ligands drives endocytosis, mediates association with proteins implicated in the organization of cell-cell junctions and, through regulated intra-membrane proteolysis, is released from the membrane as a signalin
Externí odkaz:
https://doaj.org/article/72d38d83f59e4e64a98ecbb5f20b80fe
Autor:
Copeland CR; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Pintar AL; Statistical Engineering Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Dixson RG; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Chanana A; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Srinivasan K; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Joint Quantum Institute, NIST/University of Maryland, College Park, Maryland 20742, USA., Westly DA; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Robert Ilic B; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; CNST NanoFab, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Davanco MI; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Stavis SM; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
Publikováno v:
Optica quantum [Opt Quantum] 2024 Apr 25; Vol. 2 (2), pp. 72-84. Date of Electronic Publication: 2024 Mar 18.
Autor:
Madison AC; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Pintar AL; Statistical Engineering Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Copeland CR; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Farkas N; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.; Theiss Research, La Jolla, California 92037, United States.; Building and Fire Sciences, United States Forest Service, Forest Products Laboratory, Madison, Wisconsin 53726, United States., Stavis SM; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.
Publikováno v:
ACS nano [ACS Nano] 2023 May 23; Vol. 17 (10), pp. 8837-8842.
Autor:
Pintar AL; Statistical Engineering Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899-8980 USA., Levine ZH; Quantum Measurement Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899-8441 USA., Yoon HW; Sensor Science Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899-8441 USA., Maxwell SE; Sensor Science Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899-8441 USA.
Publikováno v:
Metrologia [Metrologia] 2023; Vol. 60 (2).
Autor:
Elliott LCC; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.; University of Maryland, College Park, Maryland 20742, United States., Pintar AL; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Copeland CR; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Renegar TB; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Dixson RG; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Ilic BR; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Verkouteren RM; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Stavis SM; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.
Publikováno v:
Analytical chemistry [Anal Chem] 2022 Jan 18; Vol. 94 (2), pp. 678-686. Date of Electronic Publication: 2021 Dec 20.
Autor:
Weaver JS; Engineering Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899., Pintar AL; Information Technology Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899., Beauchamp C; Materials Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899., Joress H; Materials Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899., Moon KW; Materials Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899., Phan TQ; Engineering Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899.
Publikováno v:
Materials & design [Mater Des] 2021 Nov; Vol. 209.
Autor:
Fox JC; Intelligent Systems Division, National Institute of Standards and Technology 100 Bureau Drive, Gaithersburg, MD 20899., Pintar AL; Statistical Engineering Division National Institute of Standards and Technology 100 Bureau Drive, Gaithersburg, MD 20899.
Publikováno v:
Surface topography : metrology and properties [Surf Topogr] 2021; Vol. 9 (2).
Autor:
Kim FH; National Institute of Standards and Technology, Gaithersburg, MD 20899., Pintar AL; National Institute of Standards and Technology, Gaithersburg, MD 20899., Moylan SP; National Institute of Standards and Technology, Gaithersburg, MD 20899., Garboczi EJ; National Institute of Standards and Technology, Boulder, CO 80305.
Publikováno v:
Journal of manufacturing science and engineering [J Manuf Sci Eng] 2019 Nov; Vol. 141 (11).