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pro vyhledávání: '"Pingan Fang"'
Autor:
Liangshan Chen, Amado Longoria, Gina Cha, Gilbert Tovar, Elena Ramirez, Pingan Fang, Yong Liu, Andres Torres, Marco Alcantara, Chris Penley
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper reports the novel application of Plasma Focused Ion Beam (pFIB) to reveal subtle defects in advanced technology nodes. Two case studies presented, both of which alter the standard work procedure in order to find the defects. The first case
Publikováno v:
Journal of The Electrochemical Society. 170:050517
Lithium (Li) metal has been considered as potential choices for high-energy density batteries. However, the uncontrollable growth of Li dendrites and the infinite relative volume changes of Li anodes hinder its practical application. Herein we demons