Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Ping-hai Hao"'
Publikováno v:
Physical Review B. 50:12230-12233
Efficient infrared-upconversion luminescence in porous silicon: A quantum-confinement-induced effect
Autor:
Jia-biao Zheng, Wencheng Wang, Xiaoyuan Hou, Ping-hai Hao, Hong-bing Jiang, Xun Wang, Jian Wang, Fulong Zhang
Publikováno v:
Physical Review Letters. 69:3252-3255
We demonstrate for the first time that a porous silicon layer (PSL), which has a bright light-emission band in the range of 500--700 nm, exhibits a strong visible-range luminescence under the illumination of an infrared ultrashort pulsed laser. The d
Publikováno v:
Journal of Applied Physics. 75:651-653
The correlation between the Raman peak shift and the linewidth of porous silicon is studied. The experimental result does not fit with the relationship predicted by the phonon confinement model. By taking into account both the phonon confinement and
Publikováno v:
Physical Review Letters. 71:1265-1267
In the present work energies of photoluminescent (PL) peaks of porous Si were measured on as-etched samples. It was found that the PL peak energies occur only at or nearly at a series of discrete values and exhibit a «pinning» characteristic. A tig
Autor:
Hong-bing Jiang, Jian Wang, Xun Wang, Wencheng Wang, Xiaoyuan Hou, Ping-hai Hao, Jia-biao Zheng, Fulong Zhang
Publikováno v:
Physical review. B, Condensed matter. 48(8)
It is demonstrated that the infrared-upconversion luminescence generation from porous silicon, which was considered as an enhanced third-order nonlinear optical effect in our recent work, is anisotropic as the polarization vector of normally incident
Autor:
You-Hua Qian, Xing-Wei Feng, Da-Ming Huang, Xun Wang, Xiaoyuan Hou, Ping-hai Hao, Liang-Yao Chen, Fulong Zhang
Publikováno v:
Extended Abstracts of the 1993 International Conference on Solid State Devices and Materials.
Autor:
Fu–Long Zhang, Xun Wang, Xing Wei Feng, Da–Ming Huang, Ping–Hai Hao, Xiaoyuan Hou, Y.H. Qian, Liang Yao Chen
Publikováno v:
Japanese Journal of Applied Physics. 33:1937
Porous-Si samples were optically studied by using the photoluminescence, Raman scattering, the absolute reflectance and ellipsometry methods. Results show that the porous Si has low optical constants, and can trap more than 95% of the visible photons
Autor:
Jian, Wang, Hong-bing, Jiang, Wen-cheng, Wang, Jia-biao, Zheng, Fu-long, Zhang, Ping-hai, Hao, Xiao-yuan, Hou, Xun, Wang
Publikováno v:
Acta Physica Sinica; Sep1993, Vol. 2 Issue 9, p1-1, 1p