Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Ping Linda Zhang"'
Publikováno v:
2021 China Semiconductor Technology International Conference (CSTIC).
Chlorine-based plasma of BCl3/CCl4 etc. was applied to dry-etch PVD sputtered 1.2µm aluminum alloy with Al-Si-Cu 98%-1%-1%. AZ-1500 resist acted as the etching mask for Al. XRD of alloy with annealing temperature of 300°C, 400°C on TEOS oxide and
Publikováno v:
ECS Transactions. 34:365-370
X-ray diffraction of antimony doped single crystal (100) surface with the concentration of 1.4~4.7x1018/cm3 is reported. The lattice constant is the same as Si. The anisotropic etching changed the very top fourfold rotational symmetrical (100) surfac
Autor:
Ping Linda Zhang, Zhong Yuan Jin, Lu Chuan Zhang, Song Hu, Hai Liang Yu, Li Yu Liu, Yong Yang, Le Wang
Publikováno v:
SPIE Proceedings.
With decreasing CD in semiconductor industry, the ability to detect smaller resist particles on wafers after photolithography process becomes increasingly important for the advanced photolithography processes. It is important to be able to detect the
Publikováno v:
SPIE Proceedings.
Modulation Transfer Function (MTF) for the aerial image formation and Critical Modulation Transfer Function (CMTF) from the image formation system are two most important parameters for the photolithography processes. In this paper, we studied CMTF, o
Publikováno v:
2007 International Workshop on Electron Devices and Semiconductor Technology (EDST).
Magnetron Physical Vapor Deposition of Aluminum (Al) on single crystal Si (111) at 400 ° C and on oxide at the room temperature are studied by x-ray diffraction and the field-emission scanning electron microscopy. We focused our study on aluminum gr
Publikováno v:
SPIE Proceedings.
Historically diazoquinone/novolak- the two-component photosensitive material (photoresist) was efficiently used in various industries. In the semiconductor industry it is used for the high contrast, high resolution binary image formation for the inte