Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Pietila TM"'
Autor:
Horner M; ANSYS, Inc., Evanston, IL., Luke SM; Synopsys Inc., Exeter, UK., Genc KO; Synopsys Inc., Mountain View, CA., Pietila TM; Materialise, Plymouth, MI., Cotton RT; Synopsys Inc., Mountain View, CA., Ache BA; Micro Photonics, Inc., Allentown, PA., Levine ZH; National Institute of Standards and Technology (NIST), Gaithersburg, MD., Townsend KC; Materialise, Plymouth, MI.
Publikováno v:
Journal of verification, validation, and uncertainty quantification [J Verif Valid Uncertain Quantif] 2019; Vol. 4 (4).