Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Pierre-Francois Staub"'
Autor:
Valeria Dulio, Nikiforos Alygizakis, Kelsey Ng, Emma L. Schymanski, Sandrine Andres, Katrin Vorkamp, Juliane Hollender, Saskia Finckh, Reza Aalizadeh, Lutz Ahrens, Elodie Bouhoulle, Ľuboš Čirka, Anja Derksen, Geneviève Deviller, Anja Duffek, Mar Esperanza, Stellan Fischer, Qiuguo Fu, Pablo Gago-Ferrero, Peter Haglund, Marion Junghans, Stefan A. E. Kools, Jan Koschorreck, Benjamin Lopez, Miren Lopez de Alda, Giuseppe Mascolo, Cécile Miège, Leonard Osté, Simon O’Toole, Pawel Rostkowski, Tobias Schulze, Kerry Sims, Laetitia Six, Jaroslav Slobodnik, Pierre-François Staub, Gerard Stroomberg, Nikolaos S. Thomaidis, Anne Togola, Giorgio Tomasi, Peter C. von der Ohe
Publikováno v:
Environmental Sciences Europe, Vol 36, Iss 1, Pp 1-22 (2024)
Abstract Background Prioritisation of chemical pollutants is a major challenge for environmental managers and decision-makers alike, which is essential to help focus the limited resources available for monitoring and mitigation actions on the most re
Externí odkaz:
https://doaj.org/article/c34fe57eed5546748019d0a6f7871515
Autor:
Jose V. Tarazona, Mercedes de Alba-Gonzalez, Carole Bedos, Pierre Benoit, Colette Bertrand, Olivier Crouzet, Cécile Dagès, Jean-Lou CM Dorne, Ana Fernandez-Agudo, Andreas Focks, Maria del Carmen Gonzalez-Caballero, Alexandra Kroll, Matthias Liess, Susana Loureiro, Manuel E. Ortiz-Santaliestra, Jes J. Rasmussen, Raphaël Royauté, Maj Rundlöf, Ralf B. Schäfer, Stephen Short, Ayesha Siddique, José Paulo Sousa, Dave Spurgeon, Pierre-François Staub, Chris J. Topping, Marc Voltz, Johan Axelman, Annette Aldrich, Sabine Duquesne, Vanessa Mazerolles, Yann Devos
Publikováno v:
Environment International, Vol 191, Iss , Pp 108999- (2024)
While pesticide use is subject to strict regulatory oversight worldwide, it remains a main concern for environmental protection, including biodiversity conservation. This is partly due to the current regulatory approach that relies on separate assess
Externí odkaz:
https://doaj.org/article/764f87173c94442eaf833e411f4595cd
Publikováno v:
The European Physical Journal Applied Physics. 24:115-119
Electron-induced X-ray emission spectroscopy (EXES) combined with a semi-empirical electron scattering model, which describes the ionizations inside a material under electron irradiation, is used to determine the depth profile of shallow and ultra-sh
Autor:
Chrystel Hombourger, Pierre-Francois Staub, E. de Chambost, M. Schuhmacher, C. Hitzman, F. Desse
Publikováno v:
Applied Surface Science. :383-386
A new technique, the Low energy Electron induced X-ray Emission Spectroscopy (LEXES) is used to determine dose of shallow dopants and film thicknesses; it is element selective and can resolve depth in the nanometer range. CAMECA has developed a speci
Autor:
Pierre-Francois Staub
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 12(4)
We describe the recent introduction of low energy X-ray emission spectrometry as a metrology technique to control the fabrication process in the integrated circuit industry. The benefits of this particular analytical method and the wide field of pote
Autor:
D. Kouzminov, H. Graoui, Pierre-Francois Staub, J. Hunter, C. Hombourger, Amir Al-Bayati, M. Schuhmacher, Yupu Li Yupu Li, Majeed A. Foad
Publikováno v:
Ion Implantation Technology. 2002. Proceedings of the 14th International Conference on.
There has been increasing interest in using Indium (In+) as the channel and substrate dopant in place of the lighter boron atom. Indium is a heavier atom and hence yields a more controllable and steeper dopant profile, which is extremely important to
Publikováno v:
Ion Implantation Technology. 2002. Proceedings of the 14th International Conference on.
This paper reports on the development and use of low energy x-ray emission spectroscopy (LEXES) for non-destructive dosimetry of low energy ion implants. Secondary Ion Mass Spectrometry (SIMS) is often considered the technique of choice for ion impla
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 20:436
A technique using low energy x-ray emission spectroscopy (LEXES) is used to determine the dose of shallow implanted dopants. This technique is nondestructive and dopant selective. This technique can provide absolute dose values. CAMECA has developed
Publikováno v:
ResearcherID
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::29336d56693b3c5f8a9ed0fd626c9e28
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:A1997XY84100005&KeyUID=WOS:A1997XY84100005
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:A1997XY84100005&KeyUID=WOS:A1997XY84100005