Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Pierre Bertram"'
Autor:
Karine Mourgues, J. Marcon, Mohamed Masmoudi, Pierre Bertram, Philippe Eudeline, Mohamed Ali Belaïd, M. Gares, Hichame Maanane, Clément Tolant
Publikováno v:
Microelectronics Reliability. 46:1806-1811
This paper presents an innovative reliability bench specifically dedicated to high RF power device lifetime tests under pulse conditions for radar application. A base-station dedicated LDMOS transistor has been chosen for RF lifetests and a complete
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11c6f12ee1122b2cceef95879865c8e1
https://doi.org/10.1016/j.microrel.2006.07.074
https://doi.org/10.1016/j.microrel.2006.07.074
Autor:
J. Marcon, Philippe Eudeline, Mohamed Gares, Mohamed Masmoudi, Pierre Bertram, Karine Mourgues, Mohamed Ali Belaïd, Hichame Maanane
Publikováno v:
CCECE
L'effet de la temperature sur les parametres du composant RF LDMOS de puissance est mis en evidence. En effet, l'acceleration des mecanismes de degradation est liee, directement ou indirectement, a la variation de la temperature. Les tests pratiques
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::01e3839d84d660004f0df49b1b4bb0f4
https://doi.org/10.1109/ccece.2006.277631
https://doi.org/10.1109/ccece.2006.277631