Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Pierre A. Stadelmann"'
Practical method for high-resolution imaging of polymers by low-voltage scanning electron microscopy
Publikováno v:
Scanning. 26:122-130
Morphologic characterization of polymers by scanning electron microscopy (SEM) is often made difficult by their sensitivity to electron beam damage. We describe here a specimen preparation method for the imaging of polymer blends by low-voltage SEM (
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6fc8c047f7cc2aafb17e84f0448e07e3
https://doi.org/10.1002/sca.4950260304
https://doi.org/10.1002/sca.4950260304
Publikováno v:
Zeitschrift f�r Physik D Atoms, Molecules and Clusters. 40:425-428
High resolution transmission electron microscopy and electron energy loss spectroscopy are used to investigate plasmon losses of aluminum nanospheres and carbon nanotubes with high spatial resolution. We observe that some features of the spectra depe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b0e4a352dfa4a100e5e5fef3e175354
https://doi.org/10.1007/s004600050243
https://doi.org/10.1007/s004600050243
Publikováno v:
Microscopy Microanalysis Microstructures. 7:225-234
The complicated rhombohedral unit cell of crystalline 03B2-boron containing 105 atoms is a good approximant structure for a quasicrystal. Thus one may wonder if between the amorphous and the crystalline phases of boron, a non-metallic quasi-crystalli
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d4f97babb82755b5a7309928136610e5
https://doi.org/10.1051/mmm:1996118
https://doi.org/10.1051/mmm:1996118
Practical method for high-resolution imaging of polymers by low-voltage scanning electron microscopy
Publikováno v:
Scanning. 26(3)
Morphologic characterization of polymers by scanning electron microscopy (SEM) is often made difficult by their sensitivity to electron beam damage. We describe here a specimen preparation method for the imaging of polymer blends by low-voltage SEM (
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::9dca67bf23b0a46689cdcded242c9278
https://pubmed.ncbi.nlm.nih.gov/15283248
https://pubmed.ncbi.nlm.nih.gov/15283248
Publikováno v:
Small Particles and Inorganic Clusters ISBN: 9783642645860
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c4d1ea480b732280dc96396a40406908
https://doi.org/10.1007/978-3-642-60854-4_100
https://doi.org/10.1007/978-3-642-60854-4_100
Autor:
Pierre A. Stadelmann
Publikováno v:
Micron and Microscopica Acta. 22:175-176
Note: chercher (proceeding ou article ?) Reference CIME-ARTICLE-1991-010doi:10.1016/0739-6260(91)90147-R Record created on 2007-02-15, modified on 2017-05-12
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6e12cd350ff1ee6d3f4f98f3be04a14d
https://doi.org/10.1016/0739-6260(91)90147-r
https://doi.org/10.1016/0739-6260(91)90147-r
Autor:
Gopakumar Gopalakrishnan, Jean-Manuel Segura, Dimitrios Stamou, Cédric Gaillard, Marinela Gjoni, Ruud Hovius, Kurt J. Schenk, Pierre A. Stadelmann, Horst Vogel
Publikováno v:
Angewandte Chemie International Edition; Aug2005, Vol. 44 Issue 31, p4957-4960, 4p
Autor:
Gopakumar Gopalakrishnan, Jean-Manuel Segura, Dimitrios Stamou, Cédric Gaillard, Marinela Gjoni, Ruud Hovius, Kurt J. Schenk, Pierre A. Stadelmann, Horst Vogel
Publikováno v:
Angewandte Chemie International Edition; Aug2005, Vol. 44 Issue 31, p4815-4815, 1p
Autor:
Gopakumar Gopalakrishnan, Jean-Manuel Segura, Dimitrios Stamou, Cédric Gaillard, Marinela Gjoni, Ruud Hovius, Kurt J. Schenk, Pierre A. Stadelmann, Horst Vogel
Publikováno v:
Angewandte Chemie; Jul2005, Vol. 117 Issue 31, p4893-4893, 1p