Výsledky vyhledávání - "Piazza, Fausto"

Akademický článek

Development and application of the Oxide Stress Separation technique for the measurement of ONO leakage currents at low electric fields in 40 nm floating gate embedded-flash memory

Autor: Dobri, Adam, Jeannot, Simon, Piazza, Fausto, Jahan, Carine, Coignus, Jean, Perniola, Luca, Balestra, Francis

Publikováno v: In Microelectronics Reliability February 2017 69:47-51

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Oxide Stress Separation technique for the assessment of Inter-Gate Dielectric integrity in 40 nm Flash memory cells

Autor: Dobri, Adam, Jeannot, Simon, Piazza, Fausto, Jahan, Carine, Coignus, Jean, Perniola, Luca, Balestra, Francis

Publikováno v: 2015 SISC Book of Abstracts
46th IEEE Semiconductor Interface Specialists Conference (SISC)
46th IEEE Semiconductor Interface Specialists Conference (SISC), IEEE, Dec 2015, Arlington, United States. pp.12.15

session poster; International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::10556a5577703daf224d6979e352a917
https://hal.archives-ouvertes.fr/hal-02015384

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Akademický článek

Damage Generation and Location in n- and p-MOSFETs Biased in the Substrate-Enhanced Gate Current Regime.

Autor: Driussi, Francesco, Esseni, David, Selmi, Luca, Piazza, Fausto

Publikováno v: IEEE Transactions on Electron Devices; May2002, Vol. 49 Issue 5, p787, 8p, 4 Black and White Photographs, 15 Graphs

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