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pro vyhledávání: '"Philippe R. Suchet"'
Publikováno v:
40th ARFTG Conference Digest.
The purpose of this paper is to identify the differences between millimetre-wave small-signal scattering parameter device measurements on-wafer in coplanar and microstrip test formats. Calibration in coplanar and microstrip is examined to determine t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d64a652c43232488a9ce9d6bbf1ae4b0
https://doi.org/10.1109/arftg.1992.326996
https://doi.org/10.1109/arftg.1992.326996
