Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Philippe Larre"'
Publikováno v:
International Symposium for Testing and Failure Analysis.
Nanoprobing and subsequent electron beam induced current imaging technique are commonly used techniques for fault localization. The failing structure/device being electrically tested, the behavior of the electrical characteristics allows to give hypo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c0550eb7ecc855e25138885dcda093a0
https://doi.org/10.31399/asm.cp.istfa2017p0476
https://doi.org/10.31399/asm.cp.istfa2017p0476
Publikováno v:
International Symposium for Testing and Failure Analysis.
In semiconductor industries, development of new technologies and new products generally follows a phase of yield improvement where Failure Analysis expertise is used to locate and fix killer defects and for design debug. When process and design reach
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9498eab6d9d5d742a327da9516f36869
https://doi.org/10.31399/asm.cp.istfa2012p0232
https://doi.org/10.31399/asm.cp.istfa2012p0232