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pro vyhledávání: '"Philipp Gribisch"'
Publikováno v:
IEEE Transactions on Electron Devices. 70:2408-2414
Autor:
Sami Suihkonen, Philipp Gribisch, Dipankar Saha, Swaroop Ganguly, Sreenadh Surapaneni, Apurba Laha, Jori Lemettinen, H. J. Osten, Ravindra Singh Pokharia, Dhiman Nag, Ritam Sarkar, Bhanu B. Upadhyay, Swagata Bhunia
Publikováno v:
IEEE Transactions on Electron Devices. 68:2653-2660
In this article, we report the temperature-dependent transistor characteristic of Epi-Gd2O3/AlGaN/GaN metal oxide semiconductor high electron mobility transistor (MOSHEMT) and compare its properties with that of AlGaN/GaN metal-Schottky high electron
Publikováno v:
ECS Transactions. 93:57-60
Gadolinium oxide (Gd2O3) was grown at low temperatures (250 °C) on Si(001) using molecular beam epitaxy. The crystal structure was investigated with X-ray diffraction experiments, where the crystal structure changes from cubic to monoclinic dependin
Publikováno v:
Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials. 75:59-70
The influence of growth conditions on the layer orientation, domain structure and crystal structure of gadolinium oxide (Gd2O3) on silicon (001) has been investigated. Gd2O3 was grown at low (250°C) and high (850°C) temperatures with different oxyg
Autor:
Philipp, Gribisch, Andreas, Fissel
Publikováno v:
RSC advances. 11(29)
The structural and morphological properties of gadolinium oxide (Gd
Autor:
Philipp Gribisch, Andreas Fissel
Publikováno v:
Semiconductor Science and Technology. 36:115016
Autor:
Krista Khiangte Roluahpuia, H. J. Osten, Udayan Ganguly, Amita Rawat, Apurba Laha, Philipp Gribisch, Suddhasatta Mahapatra
Publikováno v:
Thin Solid Films. 731:138732
Germanium-on-insulator (GeOI) technology is a potential-alternative to the bulk-silicon based devices for radio-frequency (RF), and complementary metal oxide semiconductor applications at advanced technology nodes. A thin germanium channel is the key
Epi-Gd2O3/AlGaN/GaN MOS HEMT on 150 mm Si wafer: A fully epitaxial system for high power application
Autor:
Apurba Laha, Swaroop Ganguly, H. J. Osten, Dipankar Saha, Ritam Sarkar, Dhiman Nag, Christoffer Kauppinen, B. C. Barik, K. Das Gupta, Iurii Kim, Philipp Gribisch, Jori Lemettinen, Swagata Bhunia, Sami Suihkonen
In this letter, we report the impact of epitaxial Gd2O3 on the electrical properties of an AlGaN/GaN high electron mobility transistor (HEMT) grown on a 150 mm diameter Si (111) substrate. Incorporation of epitaxial Gd2O3 grown by the molecular beam
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7928126591a8a7965aefbd49476fe33f
https://aaltodoc.aalto.fi/handle/123456789/40006
https://aaltodoc.aalto.fi/handle/123456789/40006
Influence of nanostructure formation on the crystal structure and morphology of epitaxially grown Gd
Publikováno v:
Acta crystallographica Section B, Structural science, crystal engineering and materials. 75(Pt 1)
The influence of growth conditions on the layer orientation, domain structure and crystal structure of gadolinium oxide (Gd
Publikováno v:
Frontiers of Materials Science. 9:141-146
The step-flow growth condition of Si on Si(111) near the (7×7)-“1×1” surface phase transition temperature T C are analyzed within the framework of Burton-Cabrera-Frank theory. In particular, coexistence of both surface phases well below T C and