Zobrazeno 1 - 10
of 77
pro vyhledávání: '"Philip M Rice"'
Autor:
Stuart S. P. Parkin, Jaewoo Jeong, Igor V. Maznichenko, Philip M. Rice, E. K. U. Gross, Mahesh G. Samant, Pengfa Xu, Arthur Ernst, Ingrid Mertig, K. Mohseni, Holger L. Meyerheim, Wei Han, Sergey Ostanin
Publikováno v:
Advanced Materials. 29
Autor:
Pengfa, Xu, Wei, Han, Philip M, Rice, Jaewoo, Jeong, Mahesh G, Samant, Katayoon, Mohseni, Holger L, Meyerheim, Sergey, Ostanin, Igor V, Maznichenko, Ingrid, Mertig, Eberhard K U, Gross, Arthur, Ernst, Stuart S P, Parkin
Publikováno v:
Advanced materials (Deerfield Beach, Fla.). 29(10)
A conducting 2D electron gas (2DEG) is formed at the interface between epitaxial LaFeO
Autor:
Edward H. Sargent, Leslie E. Krupp, John D. Bass, Ho-Cheol Kim, Susanna M. Thon, Illan J. Kramer, Philip M. Rice, Ratan Debnath, Teya Topuria, Alexander H. Ip, David Zhitomirsky
Publikováno v:
Advanced Materials. 24:2315-2319
A bulk heterojunction of ordered titania nanopillars and PbS colloidal quantum dots is developed. By using a pre-patterned template, an ordered titania nanopillar matrix with nearest neighbours 275 nm apart and height of 300 nm is fabricated and subs
Autor:
Xin Ai, John D. Bass, J. Campbell Scott, Abdulaziz A. Bagabas, Philip M. Rice, Qing Song, Robert D. Miller, Teya Topuria, Fahhad H. Alharbi, Ho-Cheol Kim
Publikováno v:
Angewandte Chemie International Edition. 50:6538-6542
Efficient purification is critical to the fundamental and practical exploitation of nanoparticles in the technological domain. Whether for lighting, bio-imaging, coatings, photovoltaics, or displays, a routine, low-cost purification method that is di
Autor:
In-Joo Chin, Teya Topuria, Philip M. Rice, Ho-Cheol Kim, Robert D. Miller, Thilo Stöferle, Rainer F. Mahrt, Gabriele Rainò, Chanhee Park
Publikováno v:
ACS Nano. 5:3536-3541
We investigate a hybrid nanocomposite combining fluorescent dyes and ultrasmall (
Autor:
Daniele Caimi, M. Sousa, David J. Webb, C. Rossel, Teya Topuria, Jean Fompeyrine, Philip M. Rice, Christian Gerl, Chiara Marchiori, M. Richter, Heinz Siegwart
Publikováno v:
Journal of Crystal Growth. 323:387-392
For heterogeneous integration of III-V compound materials on 200 mm Si wafers, we present a complete in-situ molecular beam epitaxy (MBE) process from a Ge strain compensating buffer on Si to GaAs heteroepitaxy. The whole growth process, including hi
Autor:
Teya Topuria, Christian Gerl, Devendra K. Sadana, Philip M. Rice, Chiara Marchiori, M. Richter, M. J. P. Hopstaken, Dirk Pfeiffer, M. S. Gordon
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 28:1287-1297
The authors have investigated the sputtering behavior and evolution of depth resolution upon low energy ion irradiation during secondary ion mass spectrometry (SIMS) depth profiling of GaAs. They presented a systematic and quantitative study of the i
Autor:
Marilyne Sousa, Christian Gerl, Edward W. Kiewra, Teya Topuria, Chiara Marchiori, M. Richter, Jean Fompeyrine, Michael S. Gordon, Devendra K. Sadana, Philip M. Rice, Paul Ronsheim, Yanning Sun, Dirk Pfeiffer, Marinus Hopstaken
Publikováno v:
ECS Transactions. 28:207-215
We investigate the sputtering behavior and depth resolution upon low energy ion irradiation during Secondary Ion Mass Spectrometry (SIMS) depth profiling of GaAs. We present a systematic and quantitative study of the impact of ion species, primary io
Autor:
Robert A. Buhrman, Jordan A. Katine, Patrick M. Braganca, Daniel C. Ralph, Jeffrey R. Childress, D. Mauri, Philip M. Rice, E. Delenia, N. C. Emley
Publikováno v:
IEEE Transactions on Nanotechnology. 8:190-195
Using a self-aligned fabrication process together with multiple-step aligned electron beam lithography, we have developed a nanopillar structure where a third contact can be made to any point within a thin-film multilayer stack. This substantially en
Autor:
Teya Topuria, Joy Cheng, Hiroshi Ito, Mark W. Hart, Leslie E. Krupp, Robert D. Miller, Ho-Cheol Kim, Oun-Ho Park, Philip M. Rice
Publikováno v:
Advanced Materials. 20:738-742