Zobrazeno 1 - 10
of 23
pro vyhledávání: '"Ph. Gasser"'
Publikováno v:
Journal of Composite Materials. 43:959-976
Fiber reinforced composites, especially laminates, generally suffer from relatively weak resistance to delamination, to compression, and to out-of-plane loading. Fibre-reinforced laminates with matrix materials obtained from modification of epoxy res
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf1a4c04dc5ab0e51cd426978f1e665f
https://doi.org/10.1177/0021998308100799
https://doi.org/10.1177/0021998308100799
Autor:
Michel Barbezat, Ph. Gasser, Xavier Kornmann, A. Necola, Andreas J. Brunner, M. Rees, R. Thomann
Publikováno v:
Engineering Fracture Mechanics. 73:2336-2345
Dispersion of nano-sized, silicate-based filler in epoxy resin is expected to yield improved materials properties in several areas. Various mechanical properties, specifically improved fracture toughness, as well as improved flame-retardant effects a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7d20f85954653ba567f681a588a0596d
https://doi.org/10.1016/j.engfracmech.2006.05.004
https://doi.org/10.1016/j.engfracmech.2006.05.004
Publikováno v:
Surface and Coatings Technology. 200:5908-5914
Multilayered aluminium-coated polymer laminates are the common barrier envelopes of vacuum insulation panels used as thermal insulations in building applications. These laminates are made of up to ten distinct layers including three barrier layers ma
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::89f62ef249e73e8adc294c83bc02076c
https://doi.org/10.1016/j.surfcoat.2005.09.011
https://doi.org/10.1016/j.surfcoat.2005.09.011
Publikováno v:
Electrochimica Acta. 51:2182-2187
This work investigates selective dissolution of n-InP(1 0 0) triggered by surface defects. Nanometer size grooves were produced by sensitizing an InP surface with a mechanical contact patterning technique, i.e. nanoscratching at low loading forces at
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4c53ca1d8004ba5176e6329637645a81
https://doi.org/10.1016/j.electacta.2005.03.085
https://doi.org/10.1016/j.electacta.2005.03.085
Publikováno v:
physica status solidi (a). 202:2858-2869
PACS 62.20Fe, 61.50Ks, 61.43Dq, 63.20Mt, 61.72Ff, 68.37Hk The deformation mechanisms of silicon {001} surfaces during nanoscratching were found to depend strongly on the loading conditions. Nanoscratches with increasing load were performed at 2 µm/s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0559b621a8c4cc14ad3e5f925417288f
https://doi.org/10.1002/pssa.200521259
https://doi.org/10.1002/pssa.200521259
Autor:
R. Kaegi, Ph. Gasser
Publikováno v:
Journal of microscopy. 224(Pt 2)
The focused ion beam technique was used to fabricate transmission electron microscope lamellas of selected, micrometre-sized airborne particles. Particles were sampled from ambient air on Nuclepore polycarbonate filters and analysed with an environme
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::660c3eb7be02f2dce4c99142458f42dd
https://pubmed.ncbi.nlm.nih.gov/17204060
https://pubmed.ncbi.nlm.nih.gov/17204060
Autor:
Laura J. Heyderman, Frithjof Nolting, Elisabeth Müller, Ph. Gasser, Peter Fischer, S. Czekaj, Luis Lopez-Diaz
Publikováno v:
Journal of Applied Physics. 99:063904
We present a detailed study of the remanent magnetic domain configurations in demagnetized polycrystalline ferromagnetic thin film wedges of cobalt and Permalloy deposited on prepatterned silicon substrates with micrometer-sized square plateaus, whic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f863447d3b2c2b3be6bacf9ba6922a8f
https://doi.org/10.1063/1.2174119
https://doi.org/10.1063/1.2174119
Publikováno v:
Electrochemical and Solid-State Letters. 7:A41
We demonstrate selective electrodeposition of Pd into atomic force microscopy (AFM) nanoscratches produced in thermal oxide covered p-type Si(100) without creating substantial damage in the silicon substrate. A 10 nm thick thermal SiO 2 film was scra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3809f3ec8e838ed36c4ee37cb11eca58
https://doi.org/10.1149/1.1643791
https://doi.org/10.1149/1.1643791
Autor:
I. Utke, J. Michler, Ph. Gasser, C. Santschi, D. Laub, M. Cantoni, P.th A. Buffat, C. Jiao, P. Hoffmann
Publikováno v:
Advanced Engineering Materials; May2005, Vol. 7 Issue 5, p323-331, 9p
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