Annealing Behavior with Thickness Hindered Nucleation in Small-Molecule Organic Semiconductor Thin Films

Autor: Jakub Rozbořil, Henning Sirringhaus, John E. Anthony, Ondřej Caha, Jiří Novák, Petr Mikulík, Katharina Broch, Filip Münz, Roland Resel

Publikováno v: Crystal Growth & Design. 19:3777-3784

We introduce a comprehensive overview of spontaneous and thermal induced structure changes in thin films of the high performance small-molecular organic semiconductor 5,11-bis(triethyl silylethynyl) anthradithiophene (TES-ADT). Most importantly, we f

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::40fbab8669cea60090c1147caca54d1b
https://doi.org/10.1021/acs.cgd.9b00213

Study of surface quality and subsurface damage of germanium optics produced by single point diamond nanomachining

Autor: Jozef Keckes, Zdenko Zápražný, Petr Mikulík, Peter Siffalovic, Thu Nhi Tran Thi, Eva Majkova, Yuriy Halahovets, Matej Jergel, Igor MatẤko, D. Korytár

Publikováno v: EUV and X-ray Optics: Synergy between Laboratory and Space VI.

Single point diamond nanomachining allows to finish surfaces of some hard-to-machine brittle materials as for example germanium with high shape accuracy, low surface roughness and low subsurface damage. Quality of these surfaces is sufficient when in

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::8d7738f1c01e12002057859a189dc11a
https://doi.org/10.1117/12.2520970

Local strain and defects in silicon wafers due to nanoindentation revealed by full-field X-ray microdiffraction imaging

Autor: Lukas Helfen, A.N. Danilewsky, David Allen, Tilo Baumbach, Petr Mikulík, Patrick J. McNally, J. Wittge, D. Haenschke, Z. Li

Publikováno v: Journal of Synchrotron Radiation. 22:1083-1090

Quantitative characterization of local strain in silicon wafers is critical in view of issues such as wafer handling during manufacturing and strain engineering. In this work, full-field X-ray microdiffraction imaging using synchrotron radiation is e

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2f57dd6dd17008b497c803adc76e54ed
https://doi.org/10.1107/s1600577515009650

syris: a flexible and efficient framework for X-ray imaging experiments simulation

Autor: Matthias Vogelgesang, Alexey Ershov, Daniel Hänschke, Tilo Baumbach, Tomáš Faragó, Petr Mikulík

Publikováno v: Journal of synchrotron radiation. 24(Pt 6)

An open-source framework for conducting a broad range of virtual X-ray imaging experiments,syris, is presented. The simulated wavefield created by a source propagates through an arbitrary number of objects until it reaches a detector. The objects in

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0158bb30a3f4902e02148838b3b9b973
https://pubmed.ncbi.nlm.nih.gov/29091072

In-line Bragg magnifier based on V-shaped germanium crystals

Autor: Angelica Cecilia, Tilo Baumbach, Petr Mikulík, Daniel Hänschke, Dušan Korytár, Claudio Ferrari, Patrik Vagovic, Michael Fiederle, E. Hamann, Tamzin A. Lafford, Daniele Pelliccia, Yang Yang

Publikováno v: Journal of synchrotron radiation 18 (2011): 753–760. doi:10.1107/S090904951102989X
info:cnr-pdr/source/autori:Patrik Vagovic, Dusan Korytar, Petr Mikulik, Angelica Cecilia, Claudio Ferrari, Yang Yang, Daniel Haenschke, Elias Hamann, Daniele Pelliccia, Tamzin Laford, Michael Fiederle and Tilo Baumbach/titolo:In-line Bragg magnifier based on V-shaped germanium crystals/doi:10.1107%2FS090904951102989X/rivista:Journal of synchrotron radiation/anno:2011/pagina_da:753/pagina_a:760/intervallo_pagine:753–760/volume:18

In this work an X-ray imaging system based on a recently developed in-line two-dimensional Bragg magnifier composed of two monolithic V-shaped crystals made of dislocation-free germanium is presented. The channel-cut crystals were used in one-dimensi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::efd2f79a11a493b09f7e18f6b9d913ba
https://doi.org/10.1107/s090904951102989x