Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Petr Cizmar"'
Autor:
Yuana Yuana, Anita N. Böing, Anita E. Grootemaat, Edwin van der Pol, Chi M. Hau, Petr Cizmar, Egbert Buhr, Auguste Sturk, Rienk Nieuwland
Publikováno v:
Journal of Extracellular Vesicles, Vol 4, Iss 0, Pp 1-12 (2015)
Because procedures of handling and storage of body fluids affect numbers and composition of extracellular vesicles (EVs), standardization is important to ensure reliable and comparable measurements of EVs in a clinical environment. We aimed to develo
Externí odkaz:
https://doaj.org/article/89d2fe290f814c43892729a894504bb3
Autor:
Anita N. Böing, Yuana Yuana, Rienk Nieuwland, Auguste Sturk, Anita E. Grootemaat, Petr Cizmar, Egbert Buhr, Chi M. Hau, Edwin van der Pol
Publikováno v:
Journal of Extracellular Vesicles, Vol 4, Iss 0, Pp 1-12 (2015)
Journal of extracellular vesicles, 4. Taylor and Francis Ltd.
Journal of Extracellular Vesicles; Vol 4 (2015) incl supplements
Journal of Extracellular Vesicles
Journal of extracellular vesicles, 4. Taylor and Francis Ltd.
Journal of Extracellular Vesicles; Vol 4 (2015) incl supplements
Journal of Extracellular Vesicles
Because procedures of handling and storage of body fluids affect numbers and composition of extracellular vesicles (EVs), standardization is important to ensure reliable and comparable measurements of EVs in a clinical environment. We aimed to develo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::69c9d403c3551a5c1efae0b642922803
http://www.journalofextracellularvesicles.net/index.php/jev/article/view/29260/pdf_42
http://www.journalofextracellularvesicles.net/index.php/jev/article/view/29260/pdf_42
Autor:
Petr, Cizmar, Yuana, Yuana
Publikováno v:
Methods in molecular biology (Clifton, N.J.). 1660
Transmission electron microscopy (TEM) and transmission scanning electron Microscopy (TSEM), which denotes application of a scanning electron microscope (SEM) in the transmission mode, have been used to detect and characterize particles down to an im
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::67c2826a708cd2eecb58b620dbb749b3
https://pubmed.ncbi.nlm.nih.gov/28828660
https://pubmed.ncbi.nlm.nih.gov/28828660
Autor:
Petr Cizmar, Yuana Yuana
Publikováno v:
Methods in Molecular Biology ISBN: 9781493972517
Transmission electron microscopy (TEM) and transmission scanning electron Microscopy (TSEM), which denotes application of a scanning electron microscope (SEM) in the transmission mode, have been used to detect and characterize particles down to an im
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::32c2e9b61071f38ab62ad20c5efc3ff7
https://doi.org/10.1007/978-1-4939-7253-1_18
https://doi.org/10.1007/978-1-4939-7253-1_18
Autor:
Michael Krumrey, J. Pétry, Felix Meli, Egbert Buhr, Petr Cizmar, Yuana Yuana, Anaïs Nicolet, Bert de Boeck, Edwin van der Pol, Noham Sebaihi, Christian Gollwitzer, Rob H. Bergmans, Rienk Nieuwland, Vincent Fokkema
Publikováno v:
MEASUREMENT SCIENCE & TECHNOLOGY, 27(3). IOP Publishing Ltd.
In future, measurements of extracellular vesicles in body fluids could become a standard diagnostic tool in medicine. For this purpose, reliable and traceable methods, which can be easily applied in hospitals, have to be established. Within the Europ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d71c7c3ca4e8c660dd2748480149db8e
https://doi.org/10.1088/0957-0233/27/3/035701
https://doi.org/10.1088/0957-0233/27/3/035701
Publikováno v:
Scanning. 30:381-391
Resolution is a key performance metric, which often defines the quality of a scanning electron microscope (SEM). Traditionally, there is the subjective measurement of the distance between two points on special "resolution" samples and there are sever
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::55adadb1696376d4805d308d4d9dd160
https://doi.org/10.1002/sca.20120
https://doi.org/10.1002/sca.20120
Publikováno v:
Measurement Science and Technology. 28:034002
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7c27cd0a1a44dd09ac7ae7b8cb657ceb
https://doi.org/10.1088/1361-6501/28/3/034002
https://doi.org/10.1088/1361-6501/28/3/034002
Publikováno v:
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII.
Many advanced manufacturing processes employ scanning electron microscopes (SEM) for on-line critical measurements for process and quality control. This is the third of a series of papers discussing various causes of measurement uncertainty in scanne
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::78aa2a426aeb1c297735b6d0370266c9
https://doi.org/10.1117/12.2062032
https://doi.org/10.1117/12.2062032
Publikováno v:
SPIE Proceedings.
Our world is three-dimensional, and so are the integrated circuits (ICs), they have always been. In the past, for a long time, we have been very fortunate, because it was enough to measure a simple critical dimension (CD), the width of the resist lin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::810277d54d015ada52fa2041aa3ca153
https://doi.org/10.1117/12.916537
https://doi.org/10.1117/12.916537
Publikováno v:
SPIE Proceedings.
Although drift-corrected image acquisition (DCIC) reduces the drift-related blur and distortions significantly, frames may still be slightly suffer from these distortions. When the SCPM frames are taken quickly and frequently, it is possible to compe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b38abea1f2e49c14b391cfdb94152261
https://doi.org/10.1117/12.887183
https://doi.org/10.1117/12.887183