Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Peter Zoellner"'
Autor:
George Giannakopoulos, Robert Edwards, Wolfgang Schulte, Andreas Lagojda, Jan Dittgen, Hendrik Helmke, Peter Zoellner
Publikováno v:
Pest Management Science. 76:3413-3422
Background Safeners extend the application of existing herbicides by selectively enhancing tolerance in large-grained cereal crops. While their activity is linked to enhanced herbicide metabolism, their exact mode of action and reasons for their crop
EWM anpassen und erweitern, ganz nach Ihren Vorstellungen! Anhand praxisnaher Beispiele aus der Lagerverwaltung spielen Sie Lösungswege für Ihre Eigenentwicklungen durch – mit kommentiertem Code aus der Entwickler- und Beraterpraxis. Nutzen Sie F
Your warehouse is unique, so your system must be too! Explore your options for extending and customizing both embedded and decentralized EWM in SAP S/4HANA. Use function modules, BAdIs, and custom code to alter the UI, automate processes, change stan
Publikováno v:
Pest management science. 73(6)
BACKGROUND An Eleusine indica population has evolved resistance to glufosinate, a major post-emergence herbicide of global agriculture. This population was analysed for target-site (glutamine synthetase) and non-target-site (glufosinate uptake, trans
Explore extension options in SAP EWM and see how you can meet the unique functionality requirements of your warehouse. Find out how to make UI changes to transactions or generate condition-dependent actions, learn to program SAP EWM's software compon
Autor:
Tzvetan Ivanov, Andreas Schuh, Nataliya Vorbringer-Doroshovets, F. Balzer, Marcus Kaestner, Elshad Guliyev, Ivo W. Rangelow, Eberhard Manske, Manuel Hofer, Ahmad Ahmad, Jens-Peter Zoellner, Roland Fuessl
High Performance Single Nanometer Lithography (SNL) is an enabling technology for beyond CMOS and future nanoelectronics. To keep on with scaling down nanoelectronic components, novel instrumentation for nanometer precise placement, overlay alignment
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6adc61d8e64b1d940b8e7acb80f63bbc
Autor:
Ivo W. Rangelow, Jens-Peter Zoellner, Ahmad Ahmad, Mervyn Jones, Manuel Hofer, Marcus Kaestner, Elshad Guliyev, Tzvetan Ivanov, Zahid A. K. Durrani
As present CMOS devices approach technological and physical limits at the sub-10 nm scale, a ‘beyond CMOS’ information-processing technology is necessary for timescales beyond the semiconductor technology roadmap. This requires new approaches to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9476439da4c653bc4b61ae6dacbe1a36
Autor:
Ivo W. Rangelow, Tzvetan Ivanov, Steve Lenk, Marcus Kaestner, Tihomir Angelov, Andreas Schuh, N. Nikolov, Manuel Hofer, Mathias Holz, Matthias Budden, Alexander Reum, Ahmad Ahmad, Yana Krivoshapkina, Elshad Guliyev, Jens-Peter Zoellner
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 32:06F101
Scanning probes have enabled modern nanoscience and are still the backbone of today's nanotechnology. Within the technological development of AFM systems, the cantilever evolved from a simple passive deflection element to a complex microelectromechan
Autor:
Klaus-Peter Zoellner
Publikováno v:
Jahrbuch für Wirtschaftsgeschichte / Economic History Yearbook. 11