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pro vyhledávání: '"Peter Z. Takacs"'
Interferometric microscopes are used to measure surface roughness, from which the computed power spectral density function can be used to extract bandwidth-limited values of the various surface properties, such as root-mean-square (rms) height and sl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::028e15027ec26a1515603a096bf52f4a
https://escholarship.org/uc/item/4rm008db
https://escholarship.org/uc/item/4rm008db
Autor:
Nathalie Bouet, Samuel K. Barber, Rossana Cambie, Dmitriy L. Voronov, Peter Z. Takacs, Raymond Conley, Valeriy V. Yashchuk, Erik H. Anderson, Wayne R. McKinney
Publikováno v:
SPIE Proceedings.
A modulation transfer function (MTF) calibration method based on binary pseudo-random (BPR) gratings and arrays [Proc. SPIE 7077-7 (2007), Opt. Eng. 47(7), 073602-1-5 (2008)] has been proven to be an effective MTF calibration method for a number of i
Publikováno v:
Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing.
We suggest and describe the use of a binary pseudo-random grating as a standard test surface for calibration of the modulation transfer function of microscopes. Results from calibration of a MicromapTM-570 interferometric microscope are presented.
Autor:
Steve C. Irick, Peter Z. Takacs, Wayne R. McKinney, Valeriy V. Yashchuk, Alastair A. MacDowell
Publikováno v:
Yashchuk, Valeriy V.; Irick, Steve C.; MacDowell, Alastair A.; McKinney, Wayne R.; & Takacs, Peter Z.(2006). Air convection noise of pencil-beam interferometer for long trace profiler. Lawrence Berkeley National Laboratory. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/5v81n1b3
In this work, we investigate the effect of air convection on laser-beam pointing noise essential for the long trace profiler (LTP). We describe this pointing error with noise power density (NPD) frequency distributions. It is shown that the NPD spect
Autor:
Shinan Qian, Peter Z. Takacs
Publikováno v:
AIP Conference Proceedings.
As requirements for surface slope error quality of grazing incidence optics approach the 100 nanoradian level, it is necessary to improve the performance of the measuring instruments to achieve accurate and repeatable results at this level. We have i
Autor:
Peter Z. Takacs, Cynthia J. Bresloff
Publikováno v:
SPIE Proceedings.
Autor:
Peter Z. Takacs, Cynthia J. Bresloff
Publikováno v:
Optical Fabrication and Testing.
Modifications made to the Long Trace Profiler (LTP II) system at the Advanced Photon Source at Argonne National Laboratory have significantly improved the accuracy and repeatability of the instrument. The use of a Dove prism in the reference beam pat
Autor:
Peter Z. Takacs, Eugene L. Church
Publikováno v:
Surface Roughness and Scattering.
Conventional figure measurement techniques are inadequate for testing aspheres for grazing incidence applications. Conventional techniques are best suited for optical components in the shape of flats, spheres, or conical surfaces of revolution, used
Autor:
Albert F. Slomba, C. Gregory Hull-Allen, Peter Z. Takacs, Christopher J. Evans, Jean M. Bennett
Publikováno v:
Optical Fabrication and Testing Workshop.
A 4 inch (100 mm) diameter 0.75 inch (19 mm) thick fused silica optical flat is being used as the master to calibrate the 50 mm long slideways of the China Lake Nanostep Surface Profiler. The average of profiles taken along the 50 mm center sections
Autor:
Peter Z. Takacs, Eugene L. Church
Publikováno v:
Optical Society of America Annual Meeting.
The performance of soft-x-ray optics in synchrotron beam lines and for space astronomy use requires detailed knowledge of the topological properties of their surfaces. Instrumentation now exists for the measurement of surface profiles on spherical an