Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Peter Weissbrodt"'
Autor:
Jeffrey Lawrence, Andrew Stockham, Matthias Cumme, Lamarr R. Simmons, Peter Weissbrodt, Gregg T. Borek, John G. Smith, Roman Kleindienst
Publikováno v:
SPIE Proceedings.
Standard UV materials, such as ArF-grade fused silica, have impurities that lead to low transmittance, high absorption, and fluorescence when exposed to high irradiance. Calcium fluoride (CaF2), on the other hand, is a promising material for use as a
Publikováno v:
SPIE Proceedings.
Many manufacturing techniques have been developed and implemented to fabricate a wide range of micro-optical products. The challenges of the micro-optics business are diverse and tend to resist a widely accepted manufacturing process such as has been
Publikováno v:
SPIE Proceedings.
Micro and nano optics enable the control of light for producing intensity distributions with given profiles, propagation properties and polarization states. The higher the requirements on the optical function, the more complicated will be its realizi
Publikováno v:
SPIE Proceedings.
We have investigated the propagation of TM-polarized light through periodic Chromium structures. The fabrication of periodic structures was performed with electron-beam lithography. The Chromium layer covered with Chromium Oxide is opaque. Typical sl
Publikováno v:
Metrology, Inspection, and Process Control for Microlithography XVIII.
We evaluate the optical response of binary quarter micron slits and gratings in thin opaque chromium layers for measuring critical dimensions on photomasks. At present the CD is typically inspected by time expensive SEM measurements. A main disadvant
Publikováno v:
SPIE Proceedings.
The spectral response of transparent quarter micron lines in opaque Chromium layers has been studied with visible light. These lines are design elements of binary components used in advanced optical systems for microlithography. In the current fabric
Autor:
L. Raupach, Dirk-Roger Schmitt, Gabriele A. Ringel, Manfred Schrenk, Peter Weissbrodt, Erich J. Hacker, Helmut H. Toebben
Publikováno v:
SPIE Proceedings.
For future spacecrafts a lot of new UV or x-ray instruments are proposed. To enhance resolution and reduce scattering, new optical materials with optical surfaces with a roughness range of about 0.1 nm, i.e. supersmooth surfaces will be used to build
Publikováno v:
27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995.
A UHV surface analysis system combined with an optical setup was used in the present work to study the conditioning mechanism on MgF2?/LaF3 HR coatings at 248 nm excimer laser wavelength. During laser irradiation of the sample the laser-induced emiss
Publikováno v:
27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995.
The laser damage thresholds of optical coatings lie, as a rule, markedly below those of the respective bulk materials. This is due to diverse specific realstructure properties with regard to composition, crystallography, microstructure and the physic
Autor:
C. Fischer, L. Raupach, Erich J. Hacker, Rainer Henking, Bernhard Anton, Heidrun Jaenchen, Detlev Ristau, Peter Weissbrodt, Eric Eva, Norbert Kaiser, Klaus R. Mann, Dirk Mademann
Publikováno v:
SPIE Proceedings.
The design was S L(FIL)9iLL Air, with H: quarterwave layer LaF3 (Norwegian Talc), L: quarterwave layer MgF2 (Balzers),and S: substrate crystalline quartz z-cut (Steeg & Reuter) or crystalline MgF2 (Steeg & Reuter). Film thicknesses and depositionrate