Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Peter Tutto"'
Autor:
Daniel Selmeczi, Ferenc Novinics, Marshall Wilson, Peter Tutto, Geza Szitasi, Ferenc Korsos, Oliver Takacs, Andrew Findlay
Publikováno v:
2012 38th IEEE Photovoltaic Specialists Conference.
In thin film photovoltaic manufacturing, a number of different technologies are now used on an industrial scale: silicon-based thin films, CIS/CIGS-based thin films, CdTe-based films and other, more exotic materials and structures. Both during resear
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0949894a96147d365649c3628d03515d
https://doi.org/10.1109/pvsc.2012.6317660
https://doi.org/10.1109/pvsc.2012.6317660
Autor:
David Sotta, Tibor Pavelka, Richard Oechsner, Eric Don, Aron Pap, C. Laviron, Christophe Wyon, Marcus Pfeffer, Peter Tutto
Publikováno v:
AIP Conference Proceedings.
This paper presents results obtained using a Junction Photo‐Voltage (JPV) method optimized for characterization of the combined implant‐annealing process. The tool was found to be particularly suited to measurement of ultra‐shallow junction she
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f9348c58d884576effcfa85ea5c58a6
https://doi.org/10.1063/1.2401573
https://doi.org/10.1063/1.2401573
Publikováno v:
Japanese Journal of Applied Physics. 30:3630
Microwave photoconductivity decay was measured in the function of the excitation light intensity. Using a new approach to analyze recombination lifetime data an experimental method is presented which is capable of producing qualitative lateral distri
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::835b9bf48202e9721e3a7fad0691c626
https://doi.org/10.1143/jjap.30.3630
https://doi.org/10.1143/jjap.30.3630
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