Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Peter Snee"'
Autor:
Stefan De Gendt, Ingrid Cornelissen, D. Martin Knotter, M. Meuris, Paul Mertens, Peter Snee, Rita Vos, Marc Heyns, Marcel Lux
Publikováno v:
Solid State Phenomena. :165-168
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::513b719c5b2abb5ccf42db7de68c7156
https://doi.org/10.4028/www.scientific.net/ssp.65-66.165
https://doi.org/10.4028/www.scientific.net/ssp.65-66.165
Autor:
S. De Gendt, M.M. Heyns, Paul W. Mertens, Ingrid Cornelissen, D. M Knotter, Rita Vos, Peter Snee, M. Lux
Publikováno v:
1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216).
A novel, environmentally friendly process is successfully applied for the removal of photoresist and organic post-etch residues from silicon surfaces. The moist ozone gasphase process described, greatly increases the organic removal efficiency. Impro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1cda3209747c029e74361b78a228c6df
https://doi.org/10.1109/vlsit.1998.689243
https://doi.org/10.1109/vlsit.1998.689243
Publikováno v:
Pain and Therapy, Vol 8, Iss 1, Pp 89-98 (2019)
Abstract Introduction Opioid overdose rescue situations are time-critical, high-stress scenarios that frequently require nonmedical first responders or bystanders to intervene and administer naloxone to avoid opioid-induced fatalities. Training nonme
Externí odkaz:
https://doaj.org/article/c6d3bcc983484ea69881cdd431802cdf
Publikováno v:
Pain and Therapy, Vol 8, Iss 1, Pp 99-99 (2019)
Under section “Introduction”, the first sentence in the 4th paragraph was incorrectly published. The correct sentence is given below.
Externí odkaz:
https://doaj.org/article/c5b1207270fe4de4a65f28639767c2d9
Autor:
S. De Gendt, Ingrid Cornelissen, Paul W. Mertens, Rita Vos, M.M. Heyns, Marcel Lux, Sofie Mertens, Ivo Teerlinck, M. Meuris, Peter Snee, D. M Knotter, Twan Bearda, M. Schaekers, Lee M. Loewenstein
Publikováno v:
Scopus-Elsevier
The effect of various metal contaminants on the thin gate oxide integrity is investigated and a classification is made according to their final position in the structure. A simplified cleaning strategy is presented which is highly performant and at t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dc1917083fa796f453e9149cfac9472a
http://www.scopus.com/inward/record.url?eid=2-s2.0-17944393528&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-17944393528&partnerID=MN8TOARS
