Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Peter Sanchez"'
Autor:
Lisa Davidsson, Agnes Dahlstrand Rudin, Felix Peter Sanchez Klose, Alicia Buck, Lena Björkman, Karin Christenson, Johan Bylund
Publikováno v:
International Journal of Molecular Sciences, Vol 21, Iss 11, p 3750 (2020)
Gout is an inflammatory disease caused by monosodium urate (MSU) crystals. The role of neutrophils in gout is less clear, although several studies have shown neutrophil extracellular trap (NET) formation in acutely inflamed joints of gout patients. M
Externí odkaz:
https://doaj.org/article/b85bc89534bf4b20a95006744ed0fd24
Autor:
Johan Bylund, Vignesh Venkatakrishnan, Alicia Buck, Claes Dahlgren, Felix Peter Sanchez Klose, Karin Christenson, Arsham Khamzeh
Publikováno v:
ImmunoHorizons. 3:488-497
Neutrophils are capable of producing significant amounts of reactive oxygen species (ROS) by the phagocyte NADPH oxidase, which consists of membrane-bound and cytoplasmic subunits that assemble during activation. Neutrophils harbor two distinct pools
Autor:
Karin Christenson, Felix Peter Sanchez Klose, Lisa Davidsson, Johan Bylund, Alicia Buck, Agnes Dahlstrand Rudin, Lena Björkman
Publikováno v:
International Journal of Molecular Sciences
Volume 21
Issue 11
International Journal of Molecular Sciences, Vol 21, Iss 3750, p 3750 (2020)
Volume 21
Issue 11
International Journal of Molecular Sciences, Vol 21, Iss 3750, p 3750 (2020)
Gout is an inflammatory disease caused by monosodium urate (MSU) crystals. The role of neutrophils in gout is less clear, although several studies have shown neutrophil extracellular trap (NET) formation in acutely inflamed joints of gout patients. M
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Autor:
Huamei Forsman, Claes Dahlgren, Marios Stylianou, Anna Karlsson, Agnes Dahlstrand Rudin, Johan Bylund, Amanda Welin, Felix Peter Sanchez Klose, Jonas Elmwall, Constantin F. Urban, Halla Björnsdottir, Karin Christenson
Publikováno v:
Frontiers in Immunology, Vol 8 (2017)
Neutrophils have the ability to capture and kill microbes extracellularly through the formation of neutrophil extracellular traps (NETs). These are DNA and protein structures that neutrophils release extracellularly and are believed to function as a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::82a074cbec021adbe7b04b8c04dcd520
http://urn.kb.se/resolve?urn=urn:nbn:se:umu:diva-133767
http://urn.kb.se/resolve?urn=urn:nbn:se:umu:diva-133767
Autor:
Kenneth H. Nilsen, Peter Sanchez
Publikováno v:
Proceedings of the Water Environment Federation. 2010:4907-4928
Autor:
Pei-yang Yan, Barry Lieberman, Ted Liang, Emily Y. Shu, Seh-Jin Park, Guojing Zhang, Ping Qu, Alan R. Stivers, Gilroy Vandentop, Sven Henrichs, Erdem Ultanir, Peter Sanchez
Publikováno v:
SPIE Proceedings.
Extreme ultraviolet lithography (EUVL) tool development achieved a big milestone last year as two full-field Alpha Demo Tools (ADT) were shipped to customers by ASML. In the future horizon, a full field "EUV1" exposure tool from Nikon will be availab
Autor:
Chang Ju Choi, Emily Y. Shu, Seh-Jin Park, Eric J. Lanzendorf, Guojing Zhang, Alan R. Stivers, Gilroy Vandentop, Kangmin Hsia, Peter Sanchez, Jeff Farnsworth, Manish Chandhok, Pei-yang Yan, Michael J. Leeson, Yan Du, Ted Liang
Publikováno v:
SPIE Proceedings.
It becomes increasingly important to have an integrated process for Extreme UltraViolet (EUV) mask fabrication in order to meet all the requirements for the 32 nm technology node and beyond. Intel Corporation established the EUV mask pilot line by in
Autor:
Henry Yun, Peter Coon, Grace Ng, Anurag Mittal, Peter Sanchez, Daniel Tanzil, Florence Eschbach, Barbara Greenebaum, Archita Sengupta
Publikováno v:
SPIE Proceedings.
Photomask lifetime has become a challenge since the introduction of high volume manufacturing 193nm photolithograph. Photomask lifetime is being impacted by a broad range of environmental and process factors resulting in inorganics crystals and organ
Publikováno v:
SPIE Proceedings.
To reduce the risk of EUV lithography adaptation for the 32nm technology node in 2009, Intel has operated a EUV mask Pilot Line since early 2004. The Pilot Line integrates all the necessary process modules including common tool sets shared with curre